1.
Power Compression and Phase Analysis of GaN HEMT for Microwave Rec..
[1051]
|
2.
Emission and Capture Kinetics of Minority Carrier Trap in GaN Devi..
[921]
|
3.
Timing Performance Simulation for 3D 4H-SiC Detector
[690]
|
4.
离散网络实验教学电路板及连接方法
[623]
|
5.
Analysis of Abnormal GIDL Current Degradation Under Hot Carrier St..
[515]
|
6.
Single-trap emission kinetics of vertical β-Ga2O3 Schottky diodes..
[498]
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7.
Active Matrix Monolithic LED Micro-Display Using GaN-on-Si Epilaye..
[471]
|
8.
Submonolayer quantum dot quantum cascade long-wave infrared photod..
[418]
|
9.
Emission and Capture Characteristics of Electron Trap (Eemi = 0.8e..
[412]
|
10.
Device Design Assessment of GaN Junction Barrier Schottky Diodes
[406]
|
11.
Temperature-Dependent Dynamic Degradation of Carbon-Doped GaN HEMT..
[401]
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12.
Relaxation kinetics of interface states and bulk traps in atomic l..
[398]
|
13.
Temperature-Dependent Dynamic Performance of p-GaN Gate HEMT on Si
[392]
|
14.
Study of Minority Carrier Traps in p-GaN Gate HEMT by Optical Deep..
[390]
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15.
RF p-GaN HEMT with 0.9-dB Noise Figure and 12.8-dB Associated Gain..
[373]
|
16.
Output Phase and Amplitude Analysis of GaN-based HEMT at Cryogenic..
[368]
|
17.
Neutron irradiation and polarization effect of 4H–SiC Schottky de..
[360]
|
18.
Long-Wave Infrared Sub-Monolayer Quantum dot Quantum Cascade Photo..
[347]
|
19.
Temperature-Dependent Electrical Characterizations of Neutron-Irra..
[342]
|
20.
High-Speed 46-GHz 850 nm Photodetector with Inductive Peaking
[340]
|
21.
Simulation Study of Front-illuminated GaN APD with Hole-initiated ..
[337]
|
22.
High-speed Ge-on-GaAs photodetector
[335]
|
23.
Reliable electrical performance of β-Ga2O3 Schottky barrier diode..
[335]
|
24.
InP-Based Broadband Photodetectors With InGaAs/GaAsSb Type-II Supe..
[332]
|
25.
Forward Conduction Instability of Quasi-Vertical GaN p-i-n Diodes ..
[329]
|
26.
Vertical beta-Ga2O3 Schottky Barrier Diodes with Enhanced Breakdow..
[327]
|
27.
Electrical characterization of GaN Schottky barrier diode at cryog..
[324]
|
28.
Neutron Irradiation Induced Carrier Removal and Deep-Level Traps i..
[314]
|
29.
Suppressed current collapse and improved threshold voltage stabili..
[314]
|
30.
Comparative Study on Dynamic Characteristics of GaN HEMT at 300K a..
[313]
|
31.
A review on GaN-based two-terminal devices grown on Si substrates
[309]
|
32.
Device Design Assessment of GaN Merged P-i-N Schottky Diodes
[308]
|
33.
Effect of 5 MeV proton irradiation on electrical and trap characte..
[306]
|
34.
High-Speed Photodetector With Simultaneous Electrical Power Genera..
[302]
|
35.
一种垂直型氮化镓肖特基二极管器件及其制备方法
[295]
|
36.
High-Speed Mid-Wave Infrared Uni-Traveling Carrier Photodetector w..
[295]
|
37.
一种面向倍频应用的氮化镓双向导通二极管以及制作方法
[294]
|
38.
一种双异质结单极性晶体管的器件结构
[292]
|
39.
Ion Beam Etching Enabled Recessed-Gate E-mode GaN MOS-HEMT with FO..
[292]
|
40.
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With..
[290]
|
41.
Investigation of a minority carrier trap in a NiO/β-Ga2O3p–n het..
[284]
|
42.
GaN Single Nanowire p-i-n Diode for High-Temperature Operations
[279]
|
43.
InP-Based Near Infrared/Extended-Short Wave Infrared Dual-Band Pho..
[278]
|
44.
Demonstration and modeling of frequency tripler based on GaN Schot..
[278]
|
45.
Emission and capture characteristics of deep hole trap in n-GaN by..
[278]
|
46.
Voltage-Controlled GaN HEMT-LED Devices as Fast-Switching and Dimm..
[277]
|
47.
Pulsed X-Ray Detector Based on an Unintentionally-Doped High Resis..
[272]
|
48.
Nonlinear Capacitance Compensation Method for Integrating a Metal-..
[271]
|
49.
Analysis of AM-to-PM conversion in MUTC photodiodes based on an eq..
[266]
|
50.
Dynamic Characteristics of GaN MISHEMT With 5-nm In-Situ SiNx Diel..
[256]
|
51.
Vertical Schottky barrier diodes based on a bulk $\beta$ -Ga2O3 su..
[251]
|
52.
Trapping mechanism transition of γ-ray irradiation on p-GaN gat..
[251]
|
53.
一种Ⅲ族氮化物雪崩光电二极管组件及其制备方法
[248]
|
54.
Acceleration of solving drift-diffusion equations enabled by estim..
[247]
|
55.
Trap Characterization of InGaN/GaN Blue Light Emitting Diode Grown..
[246]
|
56.
545-mA/mm E-mode Recessed-Gate GaN MOSHEMT (Vth > 4V) by Ion Beam ..
[243]
|
57.
GaN Nanowire n-i-n Diode Enabled High-performance UV Machine Visio..
[241]
|
58.
Study of Traps in p-GaN Gate HEMT by Optical DLTS
[238]
|
59.
一种氮化镓增强型垂直型晶体管组件及其制作方法
[232]
|
60.
Investigation of trapping effects in Schottky lightly doped P-GaN ..
[228]
|
61.
Radiation effects of high-fluence reactor neutron on Ni/β-Ga
[221]
|
62.
High Quality Factor AlScN Lamb Wave Resonators Using NbN/Al Top El..
[218]
|
63.
Electrical Characterization of Vertical β-Ga2 O3 SBD w/o epi-laye..
[203]
|
64.
High-Performance Machine Vision System by GaN n-i-n Nanowire
[200]
|
65.
AlGaN/GaN MOS-HEMT Enabled Optoelectronic Artificial Synaptic Devi..
[194]
|
66.
Small $\textit{V}_{\text{th}}$ Shift and Low Dynamic $\textit{R..
[188]
|
67.
Switching performance of quasi-vertical GaN-based p-i-n diodes on ..
[180]
|
68.
High Performance Monolithically Integrated GaN Driving VMOSFET on ..
[175]
|
69.
Electrical Characterization of β-Ga2O3 Power Diodes for Cryogenic..
[172]
|
70.
Simulation study of front-illuminated GaN avalanche photodiodes wi..
[171]
|
71.
Temperature-Dependent Electrical and Trap Properties of β-Ga2O3 S..
[162]
|
72.
Low-Flicker Lighting From High-Voltage LEDs Driven by a Single Con..
[157]
|
73.
Linearity-Enhanced GaN Power Amplifier with Dual-Transistor Compen..
[154]
|
74.
Fully- and Quasi-Vertical GaN-on-Si p-i-n Diodes: High Performance..
[151]
|
75.
Transistors and tunnel diodes enabled by large-scale MoS2 nanoshee..
[139]
|
76.
Investigation of interface and bulk traps in ZrO2/β-Ga2O3 metal-o..
[120]
|
77.
1.48-dB-Noise Figure E-Mode Recessed-Gate GaN MOSHEMT by Argon-Bas..
[71]
|
78.
Dynamic Characteristics of Neutral Beam Etching Enabled Normally-o..
[66]
|
79.
Neutral Beam Etching Enabled Recessed-Gate Emode GaN MOSHEMT: A Mu..
[59]
|
80.
ZrO2/β-Ga2O3 MOS器件的界面态和体陷阱物性研究
[26]
|
81.
1.48 dB-Noise Figure E-Mode Recessed-Gate GaN MOSHEMT by Neutraliz..
[22]
|
82.
Nonlinear Characteristics Analysis of GaN p-i-n Diodes at Room and..
[12]
|
83.
氧化镓异质衬底集成技术研究进展
[5]
|