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成果统计

合作作者[TOP 5]

  • 杨雨梦

    合作成果数：6

  • 吴涛

    合作成果数：4

  • Rajkumar Subramani

    合作成果数：2

  • Amit Kumar Shukla

    合作成果数：2

  • Gao, Yuan

    合作成果数：2

访问统计


  总访问量
 437
  访问来源
    内部： 1
    外部： 436
    国内： 375
    国外： 62

  年访问量
 76
  访问来源
    内部： 0
    外部： 76
    国内： 68
    国外： 8

  月访问量
 9
  访问来源
    内部： 0
    外部： 9
    国内： 7
    国外： 2

访问量

访问量

1. Analysis of Abnormal GIDL Current Degradation Under Hot Carrier St.. [515]
2. Compensation of Hot Carrier Degradation Enabled by Forward Back Bi.. [446]
3. 基于混合栅极结构器件的性能退化补偿方法 [430]
4. Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in.. [391]
5. Influence of Localized Hot Carrier Degradation in DSOI Device Oper.. [326]
6. Thermal conductivity of high-temperature high-pressure synthesized.. [263]

下载量

1. Influence of Localized Hot Carrier Degradation in DSOI Device Oper.. [4]
2. Compensation of Hot Carrier Degradation Enabled by Forward Back Bi.. [2]
3. Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in.. [1]
4. Analysis of Abnormal GIDL Current Degradation Under Hot Carrier St.. [1]