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HyDAS: Hybrid Domain Deformed Attention for Selective Hotspot Detection 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2025
作者:  Chen, Yuyang;  Sun, Qi;  Zheng, Su;  Zhang, Xinyun;  Yu, Bei
Adobe PDF(3014Kb)  |  收藏  |  浏览/下载:125/2  |  提交时间:2025/03/12
LVM-MO: A Large Vision Model Pioneer on Full-Chip Mask Optimization 会议论文
PROCEEDINGS - DESIGN AUTOMATION CONFERENCE
作者:  Wu, Yiwen;  Chen, Yuyang;  Yin, Shuo;  Wang, Nan;  Wu, Tao
Adobe PDF(14051Kb)  |  收藏  |  浏览/下载:110/5  |  提交时间:2025/03/12
From Flatland to Forest: Exploring Pareto-optimal Design through RTL Hierarchy Trees 会议论文
DAC '25: PROCEEDINGS OF THE 62ST ACM/IEEE DESIGN AUTOMATION CONFERENCE
作者:  Donger, Luo;  Qi, Sun;  Xingheng, Li;  Chen, Zhuo;  Bei, Yu
Adobe PDF(865Kb)  |  收藏  |  浏览/下载:47/4  |  提交时间:2025/03/12
LLM-SRAF: Sub-Resolution Assist Feature Generation Using Large Language Model 会议论文
2025 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE (DATE), Lyon, France, 31 March-2 April 2025
作者:  Tianyi Li;  Zhexin Tang;  Tao Wu;  Bei Yu;  Jingyi Yu
收藏  |  浏览/下载:11/0  |  提交时间:2025/05/26
一种热点检测模型的训练方法及热点检测方法 专利
申请号:CN202411521145.6,申请日期: 2025-02-21,类型:发明申请,状态:实质审查
发明人:  耿浩;  陈禹阳
Adobe PDF(816Kb)  |  收藏  |  浏览/下载:96/1  |  提交时间:2025/02/22
Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 卷号: 29, 期号: 5
作者:  Chen, Tinghuan;  Geng, Hao;  Sun, Qi;  Wan, Sanping;  Sun, Yongsheng
Adobe PDF(25Kb)  |  收藏  |  浏览/下载:318/33  |  提交时间:2024/10/25
Floorplanning with Edge-Aware Graph Attention Network and Hindsight Experience Replay 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS (TODAES), 2024, 卷号: 29, 期号: 3
作者:  Bo Yang;  Qi Xu;  Geng H(耿浩);  Song Chen;  Bei Yu
Adobe PDF(631Kb)  |  收藏  |  浏览/下载:363/2  |  提交时间:2024/04/05
Efficient Bilevel Source Mask Optimization 预印本
2024
作者:  
Adobe PDF(2933Kb)  |  收藏  |  浏览/下载:231/1  |  提交时间:2024/06/17
PoLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition 会议论文
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE, null,Valencia,SPAIN, MAR 25-27, 2024
作者:  Hongquan He;  Guowen Kuang;  Qi Sun;  Geng H(耿浩)
收藏  |  浏览/下载:276/0  |  提交时间:2024/04/05
AD2VNCS: Adversarial Defense and Device Variation-Tolerance in Memristive Crossbar-Based Neuromorphic Computing Systems 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS (TODAES), 2024, 卷号: 29, 期号: 1
作者:  Yongtian Bi;  Qi Xu;  Geng H(耿浩);  Song Chen;  Yi Kang
Adobe PDF(1311Kb)  |  收藏  |  浏览/下载:159/0  |  提交时间:2024/04/05
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