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Dynamic Characteristics of Neutral Beam Etching Enabled Normally-off Recessed-gate GaN MOSHEMT
期刊论文
POWER ELECTRONIC DEVICES AND COMPONENTS, 2025, 卷号: 11
作者:
Yitai zhu
;
Haitao Du
;
Yu Zhang
;
Haolan Qu
;
Haodong Jiang
Microsoft Word(2182Kb)
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浏览/下载:67/1
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提交时间:2025/03/07
Aluminum gallium nitride
Deep level transient spectroscopy
Gates (transistor)
High electron mobility transistors
Indium phosphide
Junction gate field effect transistors
MOS devices
MOSFET devices
Semiconducting aluminum compounds
Semiconducting gallium compounds
Semiconducting indium phosphide
Surface discharges
Threshold voltage
AlGaN
Dynamic performance
Dynamics characteristic
Enhancement mode
GaN metal oxide semiconductor high electron mobility transistor
Interface traps
Metal-oxide-semiconductor high-electron mobility transistors
Neutral beam etching
Normally off
Recessed gate
Reconfigurable phase-only acoustic holography with surrogate model based on soft-GAN
期刊论文
APPLIED ACOUSTICS, 2025, 卷号: 233
作者:
Lu, Qingyi
;
Zhong, Chengxi
;
Su, Hu
;
Liu, Song
Adobe PDF(5103Kb)
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浏览/下载:174/1
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提交时间:2025/03/14
Acoustic arrays - Acoustic fields - Acoustic transducers - Gallium nitride - Holograms - Sound recording
Acoustic field patterns - Acoustic field reconstruction - Deep learning - Industrial scenarios - Model-based OPC - Penetration ability - Phase-only - Phase-only acoustic holography - Reconfigurable - Surrogate modeling
Silicon-integrated scandium-doped aluminum nitride electro-optic modulator
期刊论文
PHOTONICS RESEARCH, 2025, 卷号: 13, 期号: 2, 页码: 477-487
作者:
Xu, Tianqi
;
Liu, Yushuai
;
Pu, Yuanmao
;
Yang, Yongxiang
;
Zhong, Qize
Adobe PDF(1147Kb)
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浏览/下载:382/5
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提交时间:2024/06/24
Aluminum gallium nitride - Amplitude shift keying - CMOS integrated circuits - Digital filters - Electrooptical devices - Fiber optic sensors - Frequency shift keying - Indium phosphide - Light modulation - Light modulators - Notch filters - Phase shift keying - Photonic integrated circuits - Photonic integration technology - Ring lasers - Scandium compounds - Semiconducting aluminum compounds - Semiconducting indium phosphide - Signal modulation - Silicon nitride
Electro-optic modulators - Electro-optics - Fabrication and characterizations - Functional devices - Hexagonal wurtzite structure - Nonlinear properties - Photonic circuits - Piezoelectric property - Seamless integration - Second orders
1.48-dB-Noise Figure E-Mode Recessed-Gate GaN MOSHEMT by Argon-Based Neutral Beam Etching for LNA Applications
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2025, 卷号: PP, 期号: 99
作者:
Wenbo Ye
;
Junmin Zhou
;
Han Gao
;
Haowen Guo
;
Yitian Gu
Adobe PDF(1674Kb)
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浏览/下载:72/4
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提交时间:2025/02/12
Distributed feedback lasers
Gates (transistor)
High electron mobility transistors
Junction gate field effect transistors
Leakage currents
Monolithic microwave integrated circuits
Noise figure
Enhancement-mode
Gallium nitride
High electron-mobility transistors
Low noiseamplifier
Low-noise amplifier
Metala sem-iconductor high-electron-mobility transistor (MOSHEMT)
MOSHEMT
MOSHEMTs
Neutral beam etching
Adaptive Virtual Bus Strategy for Electrolytic Capacitorless DAB Microinverters
期刊论文
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2025
作者:
Chuhan Peng
;
Mingde Zhou
;
Yifan Wu
;
Minfan Fu
;
Haoyu Wang
Adobe PDF(4093Kb)
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浏览/下载:76/5
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提交时间:2025/03/11
Active power decoupling (APD), dualactive- bridge (DAB), gallium nitride (GaN), microinverter, virtual bus.
Trapping mechanism transition of γ-ray irradiation on p-GaN gate stack on gate applying voltage swing
期刊论文
APPLIED PHYSICS LETTERS, 2024, 卷号: 125, 期号: 13
作者:
Zhu, Junyan
;
Ding, Jihong
;
Ouyang, Keqing
;
Zou, Xinbo
;
Ma, Hongping
Adobe PDF(2565Kb)
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浏览/下载:254/1
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提交时间:2024/10/08
Aluminum gallium nitride
Electron traps
Gamma rays
Gates (transistor)
High electron mobility transistors
Irradiation
Junction gate field effect transistors
Threshold voltage
'current
AlGaN
Gate stacks
Mg-doping
Total ionizing dose effects
Trap density
Trap state
Trapping mechanisms
Voltage swings
Voltage-controlled
Arrayed terahertz vector measurement system based on AlGaN/GaN HEMT heterodyne mixer
期刊论文
HONGWAI YU JIGUANG GONGCHENG/INFRARED AND LASER ENGINEERING, 2024, 卷号: 53, 期号: 6, 页码: 166-175
作者:
Wang, Kaichu
;
Ding, Qingfeng
;
Zhou, Qi
;
Cai, Xinhang
;
Zhang, Jinfeng
收藏
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浏览/下载:246/0
|
提交时间:2024/09/20
Aluminum gallium nitride
Beam forming networks
Channel estimation
Chemical lasers
Computer testing
Direction of arrival
Distributed feedback lasers
Dye lasers
Frequency estimation
Gallium nitride
Heterodyne detection
Heterodyning
Heterojunctions
High electron mobility transistors
Hydrogen masers
Laser accessories
Laser theory
Liquid lasers
Radiometers
Temperature sensors
Terahertz wave detectors
Tetrodes
Time difference of arrival
AlGaN/GaN high electron mobility transistors
Arrayed detector
Coherent detection
Directionof-arrival (DOA)
Estimation of direction of arrival terahertz wave
Field of views
Heterodyne (coherent) detection
Linear-array
Tera Hertz
Vector detection
Synthesis of Narrow Band Gap Gallium Zinc Nitride Oxide Solid Solutions for Photocatalytic Water Splitting under Visible Light
期刊论文
CHEMISTRY OF MATERIALS, 2024, 卷号: 36, 期号: 6, 页码: 2917-2924
作者:
Iwasa, Natsutogi
;
Teng, Zhenyuan
;
Ma, Guijun
;
Hisatomi, Takashi
;
Domen, Kazunari
Adobe PDF(2475Kb)
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浏览/下载:299/1
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提交时间:2024/04/12
Aluminum nitride
Crystallinity
Energy gap
Gallium nitride
Hydrogen production
II-VI semiconductors
III-V semiconductors
Irradiation
Nitrogen
Photocatalytic activity
Solid solutions
Wide band gap semiconductors
Evacuated tubes
Free solids
Long wavelength
Narrow bandgap
Nitrogen sources
Photoresponses
Solid nitrogen
Visible light
Visible-light irradiation
Water splitting
Controllable step-flow growth of GaN on patterned freestanding substrate
期刊论文
JOURNAL OF SEMICONDUCTORS, 2024, 卷号: 45, 期号: 2
作者:
Peng Wu,
;
Jianping Liu
;
Lei Hu
;
Xiaoyu Ren,
;
Aiqin Tian
Adobe PDF(6040Kb)
|
收藏
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浏览/下载:337/0
|
提交时间:2024/03/08
Ammonia
Gallium nitride
Substrates
Atomic step
GaN substrate
Growth mechanisms
Growth modes
Growth of GaN
Motion models
Step motions
Step-flow growth
Terrace width
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:
Yu Zhang
;
Renqiang Zhu
;
Haolan Qu
;
Yitian Gu
;
Huaxing Jiang
Adobe PDF(1470Kb)
|
收藏
|
浏览/下载:291/0
|
提交时间:2024/06/11
Activation energy
Deep level transient spectroscopy
Dielectric materials
Drain current
Electric fields
Gallium nitride
High electron mobility transistors
III-V semiconductors
MOSFET devices
Stability
Threshold voltage
Current collapse
Dynamic reliability assessment
Dynamics characteristic
Dynamics stability
MOS-FET
MOSFETs
Reference devices
Time resolved measurement
Trench MOSFET
Vertical trench MOSFET
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