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PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition 会议论文
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), Valencia, Spain, 25-27 March 2024
作者:  Hongquan He;  Guowen Kuang;  Qi Sun;  Hao Geng
Adobe PDF(8911Kb)  |  收藏  |  浏览/下载:310/3  |  提交时间:2024/06/17
Efficient Bilevel Source Mask Optimization 会议论文
PROCEEDINGS - DESIGN AUTOMATION CONFERENCE, San Francisco, CA, United states, June 23, 2024 - June 27, 2024
作者:  Chen, Guojin;  He, Hongquan;  Xu, Peng;  Geng, Hao;  Yu, Bei
Adobe PDF(2933Kb)  |  收藏  |  浏览/下载:235/47  |  提交时间:2024/12/27
LLM-HD: Layout Language Model for Hotspot Detection with GDS Semantic Encoding 会议论文
PROCEEDINGS - DESIGN AUTOMATION CONFERENCE, San Francisco, CA, United states, June 23, 2024 - June 27, 2024
作者:  Chen, Yuyang;  Wu, Yiwen;  Wang, Jingya;  Wu, Tao;  He, Xuming
Adobe PDF(1643Kb)  |  收藏  |  浏览/下载:276/8  |  提交时间:2024/12/27
Mixed-Type Wafer Failure Pattern Recognition 会议论文
PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC, Tokyo, Japan, January 16, 2023 - January 19, 2023
作者:  Geng, Hao;  Sun, Qi;  Chen, Tinghuan;  Xu, Qi;  Ho, Tsung-Yi
Adobe PDF(2023Kb)  |  收藏  |  浏览/下载:288/2  |  提交时间:2023/03/10
Study of the Degradation in LDMOS with STI Technology and Improve the Reliability with Several Methods 会议论文
2022 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE, CSTIC 2022, Shanghai, China, June 20, 2022 - June 21, 2022
作者:  Xiaoming Zhang;  Donghua Liu;  Wensheng Qian
Adobe PDF(2459Kb)  |  收藏  |  浏览/下载:319/0  |  提交时间:2022/09/30
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