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PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition
会议论文
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), Valencia, Spain, 25-27 March 2024
作者:
Hongquan He
;
Guowen Kuang
;
Qi Sun
;
Hao Geng
Adobe PDF(8911Kb)
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收藏
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浏览/下载:310/3
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提交时间:2024/06/17
Noise abatement
Pattern recognition
Defect patterns
Design cycle
Die-on wafers
Failure mechanism
Mixed type
Point set
Point-clouds
Scale-down
Technology nodes
Wafer maps
Efficient Bilevel Source Mask Optimization
会议论文
PROCEEDINGS - DESIGN AUTOMATION CONFERENCE, San Francisco, CA, United states, June 23, 2024 - June 27, 2024
作者:
Chen, Guojin
;
He, Hongquan
;
Xu, Peng
;
Geng, Hao
;
Yu, Bei
Adobe PDF(2933Kb)
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浏览/下载:235/47
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提交时间:2024/12/27
Advanced technology
Alternating optimizations
Bilevel
Mask optimization
Optimization method
Process window
Resolution enhancement technique
Runtimes
Sequential optimization
Technology nodes
LLM-HD: Layout Language Model for Hotspot Detection with GDS Semantic Encoding
会议论文
PROCEEDINGS - DESIGN AUTOMATION CONFERENCE, San Francisco, CA, United states, June 23, 2024 - June 27, 2024
作者:
Chen, Yuyang
;
Wu, Yiwen
;
Wang, Jingya
;
Wu, Tao
;
He, Xuming
Adobe PDF(1643Kb)
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浏览/下载:276/8
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提交时间:2024/12/27
Benchmarking
Binary images
Image coding
Modeling languages
Natural language processing systems
Problem oriented languages
Complex designs
Detection approach
Down-scaling
Encodings
Hotspot detections
Language model
Market constraints
Pattern-matching
Technology nodes
Time to market
Mixed-Type Wafer Failure Pattern Recognition
会议论文
PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC, Tokyo, Japan, January 16, 2023 - January 19, 2023
作者:
Geng, Hao
;
Sun, Qi
;
Chen, Tinghuan
;
Xu, Qi
;
Ho, Tsung-Yi
Adobe PDF(2023Kb)
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浏览/下载:288/2
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提交时间:2023/03/10
Failure (mechanical)
Silicon wafers
Complex circuits
Defect patterns
Failure mechanism
Failure patterns
In-process
Mixed type
Reduce time
Technology nodes
Time to market
Yield rates
Semiconductor device modeling
Art
Federated learning
Statistical distributions
Feature extraction
Foundries
Data models
Study of the Degradation in LDMOS with STI Technology and Improve the Reliability with Several Methods
会议论文
2022 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE, CSTIC 2022, Shanghai, China, June 20, 2022 - June 21, 2022
作者:
Xiaoming Zhang
;
Donghua Liu
;
Wensheng Qian
Adobe PDF(2459Kb)
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收藏
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浏览/下载:319/0
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提交时间:2022/09/30
Electronic design automation
Integrated circuits
MOS devices
Degradation model
Drain voltage
Electronic simulation
Gate drain
Gate voltages
Hot carrier stress
Lateral double diffused mos (LDMOS)
Mechanism of degradation
Technology nodes
Voltage stress
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