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Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:  Yu Zhang;  Renqiang Zhu;  Haolan Qu;  Yitian Gu;  Huaxing Jiang
Adobe PDF(1470Kb)  |  收藏  |  浏览/下载:291/0  |  提交时间:2024/06/11
Analysis of Abnormal GIDL Current Degradation Under Hot Carrier Stress in DSOI-MOSFETs 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 卷号: 69, 期号: 11
作者:  Qian, Yijun;  Gao, Yuan;  Shukla, Amit Kumar;  Sun, Lu;  Zou, Xinbo
Adobe PDF(3370Kb)  |  收藏  |  浏览/下载:517/1  |  提交时间:2022/10/08
Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in PDSOI nMOSFET 会议论文
2021 IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS, TECHNOLOGIES AND APPLICATIONS, ICTA 2021, Zhuhai, China, November 24, 2021 - November 26, 2021
作者:  Qian, Yijun;  Gao, Yuan;  Shukla, Amit Kumar;  Wu, Tao;  Wei, Xing
Adobe PDF(2430Kb)  |  收藏  |  浏览/下载:392/1  |  提交时间:2022/07/01
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