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Effect of 5 MeV proton irradiation on electrical and trap characteristics of β-Ga
2
O
3
power diode
期刊论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2025, 卷号: 187
作者:
Qu, Haolan
;
Huang, Wei
;
Zhang, Yu
;
Sui, Jin
;
Yang, Ge
Adobe PDF(6465Kb)
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浏览/下载:300/4
|
提交时间:2024/11/29
Proton irradiation
Static characteristics
Trap characteristics
Dynamic characteristics
Reliable electrical performance of β-Ga2O3 Schottky barrier diode at cryogenic temperatures
期刊论文
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A: VACUUM, SURFACES AND FILMS, 2024, 卷号: 42, 期号: 2
作者:
Qu, Haolan
;
Huang, Wei
;
Zhang, Yu
;
Sui, Jin
;
Chen, Jiaxiang
Adobe PDF(3333Kb)
|
收藏
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浏览/下载:333/3
|
提交时间:2024/02/23
Carrier concentration
Cryogenics
Gallium compounds
Semiconductor metal boundaries
Temperature distribution
Blocking performance
Cryogenic temperatures
Dynamic performance
Electrical performance
Ideality factors
Lows-temperatures
Off state
Schottky characteristics
Temperature dependence
Temperature rise
Emission and capture characteristics of deep hole trap in n-GaN by optical deep level transient spectroscopy
期刊论文
JOURNAL OF SEMICONDUCTORS, 2024, 卷号: 45, 期号: 3
作者:
Jin Sui
;
Jiaxiang Chen
;
Haolan Qu
;
Yu Zhang
;
Xing Lu
Adobe PDF(4177Kb)
|
收藏
|
浏览/下载:274/0
|
提交时间:2024/04/06
GaN
deep level transient spectroscopy
minority carrier trap
time constant
trap concentration
Activation energy
Deep level transient spectroscopy
Electric fields
Hole concentration
III-V semiconductors
Laser beams
Schottky barrier diodes
Semiconductor diodes
Wide band gap semiconductors
Activation energy E
Carrier traps
Deep hole trap
Deep levels transient spectroscopy
Emission process
Minority carrier
Minority carrier trap
Optical-
Time-constants
Trap concentration
Electrical Characterization of β-Ga2O3 Power Diodes for Cryogenic Temperature Applications
会议论文
2024 THE 18TH NATIONAL CONFERENCE ON MOCVD (MOCVD)
作者:
Qu, Haolan
;
Chen, Jiaxiang
;
Zhu, Yitai
;
Lu, Xing
;
Zhang, David Wei
收藏
|
浏览/下载:169/0
|
提交时间:2024/12/01
GaN Nanowire n-i-n Diode Enabled High-performance UV Machine Vision System
期刊论文
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2024, 卷号: PP, 期号: 99, 页码: 1-6
作者:
Haitao Du
;
Yu Zhang
;
Junmin Zhou
;
Jiaxiang Chen
;
Wenbo Ye
Adobe PDF(1079Kb)
|
收藏
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浏览/下载:239/2
|
提交时间:2024/06/24
Convolution
Gallium nitride
III-V semiconductors
Image recognition
Learning systems
Nanowires
Neural networks
Accuracy
Artificial neural network
Convolutional neural network
Gallium nitride nanowires
Machine vision systems
Machine-learning
Machine-vision
Performance
The Highly Operational Team (HOT) toward
f
-Block Materials
期刊论文
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2023, 卷号: 62, 期号: 32
作者:
Park, Kyoung Chul
;
Kittikhunnatham, Preecha
;
Lim, Jaewoong
;
Thaggard, Grace C.
;
Liu, Yuan
Adobe PDF(385206Kb)
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浏览/下载:399/3
|
提交时间:2024/03/04
Investigation of a minority carrier trap in a NiO/β-Ga2O3p–n heterojunction via deep-level transient spectroscopy
期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 10, 页码: 105010
作者:
Qu, Haolan
;
Chen, Jiaxiang
;
Zhang, Yu
;
Sui, Jin
;
Zhang, Ruohan
Adobe PDF(999Kb)
|
收藏
|
浏览/下载:282/0
|
提交时间:2023/09/23
NiO/beta-Ga2O3 p-n heterojunction
deep-level transient spectroscopy
minority carrier trap
time constant
trap concentration
Neutron Irradiation Induced Carrier Removal and Deep-Level Traps in N-Gan Schottky Barrier Diodes
会议论文
CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE (CSTIC 2023), Shanghai, China, 26-27 June 2023
作者:
Jin Sui
;
Jiaxiang Chen
;
Haolan Qu
;
Ruohan Zhang
;
Min Zhu
Adobe PDF(753Kb)
|
收藏
|
浏览/下载:305/1
|
提交时间:2023/09/23
Radiation effects
Schottky diodes
Spectroscopy
Schottky barriers
Neutrons
Threshold voltage
Leakage currents
Emission and Capture Characteristics of Electron Trap (Eemi = 0.8eV) in Si-doped β-Ga2O3 Epilayer
期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2023, 卷号: 38, 期号: 1, 页码: 015001
作者:
Qu, Haolan
;
Chen, Jiaxiang
;
Zhang, Yu
;
Sui, Jin
;
Gu, Yitian
Adobe PDF(796Kb)
|
收藏
|
浏览/下载:406/0
|
提交时间:2022/11/08
Activation energy
Deep level transient spectroscopy
Electric fields
Epilayers
Capture
Capture cross sections
Deep levels transient spectroscopy
Emission
Impact of temperatures
Lambda's
Single electron
Trap
Trap concentration
Β-ga2O3
Small $\textit{V}_{\text{th}}$ Shift and Low Dynamic $\textit{R}_{\textsc{on}}$ in GaN MOSHEMT With ZrO $_{\text{2}}$ Gate Dielectric
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 卷号: PP, 期号: 99, 页码: 5590-5595
作者:
Yu Zhang
;
Yitian Gu
;
Jiaxiang Chen
;
Yitai Zhu
;
Baile Chen
Adobe PDF(1973Kb)
|
收藏
|
浏览/下载:186/1
|
提交时间:2023/10/07
Dynamic ON-resistance ( $\textit{R}_{\biosc{on}}$ )
GaN
metal–oxide–semiconductor high-electron mobility transistor (MOSHEMT)
threshold voltage ( $\textit{V}_{\text{th}}$ ) instability
ZrOTEXPRESERVE13 dielectric
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