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| Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2025, 卷号: 13, 页码:
117-127
作者: Zhidong Tang ; Zewei Wang; Yumeng Yuan; Chang He; Xin Luo
 Adobe PDF(10435Kb) |  收藏 | 浏览/下载：62/1 | 提交时间：2025/03/03
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| Compensation of Hot Carrier Degradation Enabled by Forward Back Bias in π-GAA-π MOSFET 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2023, 卷号: 11, 页码:
319-324
作者: Yijun Qian; Qiang Liu; Jialun Yao; Xiaowei Wang; Amit Kumar Shukla
Adobe PDF(4964Kb) | 收藏 | 浏览/下载：438/2 | 提交时间：2023/06/30
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| Cryogenic CMOS RF Device Modeling for Scalable Quantum Computer Design 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2022, 卷号: 10
作者: Zhidong Tang; Zewei Wang; Ao Guo; Linlin Liu; Chengwei Cao
Adobe PDF(3429Kb) | 收藏 | 浏览/下载：631/3 | 提交时间：2022/07/25 |
| Dynamic Characteristics of GaN MISHEMT With 5-nm In-Situ SiNx Dielectric Layer 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2022, 卷号: 10, 页码:
1-1
作者: Yu Zhang; Lihua Xu; Yitian Gu; Haowen Guo; Huaxing Jiang
Adobe PDF(3413Kb) | 收藏 | 浏览/下载：251/1 | 提交时间：2022/07/29 |
| Comparative Study on Dynamic Characteristics of GaN HEMT at 300K and 150K 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2020, 卷号: 8, 页码:
850-856
作者: Yangqian Wang; Yitian Gu; Xing Lu; Huaxing Jiang; Haowen Guo
Adobe PDF(2778Kb) | 收藏 | 浏览/下载：306/0 | 提交时间：2020/09/01 |
