Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design

doi:10.1109/JEDS.2025.3542589

	Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design
	Zhidong Tang1,2 ; Zewei Wang1,3 ; Yumeng Yuan1 ; Chang He1 ; Xin Luo 4; Ao Guo 3; Renhe Chen1 ; Yongqi Hu1 ; Longfei Yang 4; Chengwei Cao 4; Lin Lin Liu 4; Liujiang Yu 5; Ganbing Shang 5; Yongfeng Cao 5; Shoumian Chen 4; Yuhang Zhao 4; Shaojian Hu 4; Xufeng Kou1
	2025
发表期刊	IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY (IF:2.0[JCR-2023],2.3[5-Year])
ISSN	2168-6734
EISSN	2168-6734
卷号	13 页码:117-127
发表状态	已发表
DOI	10.1109/JEDS.2025.3542589
摘要	This paper outlines the establishment of a generic cryogenic CMOS database in which key electrical parameters and transfer characteristics of the MOSFETs are quantified as functions of device size, temperature/frequency responses. Meanwhile, comprehensive device statistical analysis is conducted to evaluate the influence of variation and mismatch effects at low temperatures. Furthermore, by incorporating the Cryo-CMOS compact model into the process design kit (PDK), the cryogenic 4 Kb SRAM and 5-bit flash ADC are designed, and their performance is investigated and optimized based on the EDA-compatible platform, hence laying a solid foundation for large-scale cryogenic IC design.
关键词	Cryogenic equipment - Integrated circuit design - Integrated circuit manufacture - MIS devices - MOSFET devices - Printed circuit design - Static random access storage Circuit designs - CMOS devices - Compact model - Cryogenic circuit design - Cryogenic device physic - Device physics - Monte Carlo's simulation - Process design kit - Temperature dependent - Temperature-dependent compact model
URL	查看原文
收录类别	EI
语种	英语
出版者	Institute of Electrical and Electronics Engineers Inc.
EI入藏号	20250917953210
EI主题词	CMOS integrated circuits
EI分类号	1103.1 Data Storage, Equipment and Techniques - 305.5 Cryogenic Equipment and Components - 713 Electronic Circuits - 714.2 Semiconductor Devices and Integrated Circuits - 904 Design - 913.6 Product Development ; Concurrent Engineering
原始文献类型	Article in Press
来源库	IEEE
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/493494
专题	信息科学与技术学院信息科学与技术学院_PI研究组_寇煦丰组信息科学与技术学院_硕士生信息科学与技术学院_博士生
作者单位	1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China 2.School of Integrated Circuits, Tsinghua University, Beijing, China 3.Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China 4.Shanghai IC Research and Development Center, Shanghai, China 5.Huali Microelectronics Corporation, Shanghai, China
第一作者单位	信息科学与技术学院
第一作者的第一单位	信息科学与技术学院
推荐引用方式 GB/T 7714	Zhidong Tang,Zewei Wang,Yumeng Yuan,et al. Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design[J]. IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY,2025,13:117-127.
APA	Zhidong Tang.,Zewei Wang.,Yumeng Yuan.,Chang He.,Xin Luo.,...&Xufeng Kou.(2025).Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design.IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY,13,117-127.
MLA	Zhidong Tang,et al."Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design".IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY 13(2025):117-127.