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[1] Wang, Qian.,Hua, Hao.,Zheng, Li.,Feng, Junhong.,Zhang, Cheng.,...&Cheng, Xinhong.(2024).Simultaneous improvement of high-frequency and Baliga figures of merit of 1.7 kV 4H-SiC MOSFET with retrograded JFET doping.JOURNAL OF PHYSICS D: APPLIED PHYSICS,57(25).浏览/下载:1634/2; 被引[WOS]:6; IF:3.1/3.0评论推荐收藏
[2] 华昊. 一种硅片缺陷态检测方法及缺陷态检测样品. 2024-06-04.浏览/下载:29/4评论推荐收藏
[3] Hua H. Characteristic Frequency Analysis Technique For Original Defects Identification In 300 Mm Crystalline Si[C]. European Materials Research Society.2024-01-01.浏览/下载:24/0评论推荐收藏