Detection and simulation of defects on precision optical surface
2023
会议录名称PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
ISSN0277-786X
卷号12617
发表状态已发表
DOI10.1117/12.2666741
摘要

Surface defects have a modulation effect on the distribution of the incident laser electric field, which limits the improvement of the laser damage threshold of optical elements, and threatens the security and stability of strong laser system. To evaluate the light field modulation caused by smaller size defects on precision optical surface upon current processing technology, several detections and numerical simulations of the defects are conducted. By measuring and counting scratches' depth and width on the surface of large-aperture neodymium glass, the distribution upon current processing technology is obtained. According to the above parameters, numerically simulating the surrounding electric field distribution of surface scratch similar to the real is performed by the finite difference time domain (FDTD) method. The results show that when the width is constant, as the depth is within 300nm, the maximum near-field electric field intensity in the scratch area is gradually increased with the increase of the depth; when the depth is constant, as the width is larger than 30μm the maximum near-field electric field intensity modulated by scratched area is inversely proportional to its width. Meanwhile, the influence of electric field distribution modulation on the surface of the optical element is in a relatively stable range as the ratio of the depth and width of scratches is under 0.15. With the raise of the ratio, the modulation effect on the surface electric field is rapidly enhanced. The research results provide some support for surface defects control and processing technology improvement. © 2023 SPIE.

会议录编者/会议主办者Chinese Society for Optical Engineering ; Science and Technology on Low-light-level Night Vision Laboratory
关键词Electric fields Finite difference time domain method Incident light Laser damage Optical materials Optical signal processing Surface defects Current processing Electric field distributions Electric field intensities Electric field modulation High-power lasers Modulation effects Near fields Optical surfaces Processing technologies Time-domain finite differences
会议名称9th Symposium on Novel Photoelectronic Detection Technology and Applications
会议地点Hefei, China
会议日期April 21, 2023 - April 23, 2023
收录类别EI
语种英语
出版者SPIE
EI入藏号20232114130652
EI主题词High power lasers
EISSN1996-756X
EI分类号701.1 Electricity: Basic Concepts and Phenomena ; 741.1 Light/Optics ; 741.3 Optical Devices and Systems ; 744.1 Lasers, General ; 744.8 Laser Beam Interactions ; 921 Mathematics ; 951 Materials Science
原始文献类型Conference article (CA)
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/305080
专题物质科学与技术学院
物质科学与技术学院_硕士生
通讯作者Ni, Kaizao; Liu, Shijie
作者单位
1.Precision Optical Manufacturing and Testing Center, Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai; 201800, China;
2.University of Chinese Academy of Sciences, Beijing; 100049, China;
3.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China;
4.College of Science, University of Shanghai for Science and Technology, Shanghai; 201210, China
推荐引用方式
GB/T 7714
Yang, Weixiang,Li, Lanqing,Ni, Kaizao,et al. Detection and simulation of defects on precision optical surface[C]//Chinese Society for Optical Engineering, Science and Technology on Low-light-level Night Vision Laboratory:SPIE,2023.
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