Depth Recovery from Light Field Using Focal Stack Symmetry

doi:10.1109/ICCV.2015.394

	Depth Recovery from Light Field Using Focal Stack Symmetry
	Lin, Haiting 1; Chen, Can 1; Kang, Sing Bing 2; Yu, Jingyi1,3
	2015
会议录名称	2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV)
ISSN	2380-7504
卷号	2015 International Conference on Computer Vision, ICCV 2015
页码	3451-3459
发表状态	已发表
DOI	10.1109/ICCV.2015.394
摘要	We describe a technique to recover depth from a light field (LF) using two proposed features of the LF focal stack. One feature is the property that non-occluding pixels exhibit symmetry along the focal depth dimension centered at the in-focus slice. The other is a data consistency measure based on analysis-by-synthesis, i.e., the difference between the synthesized focal stack given the hypothesized depth map and that from the LF. These terms are used in an iterative optimization framework to extract scene depth. Experimental results on real Lytro and Raytrix data demonstrate that our technique outperforms state-of-the-art solutions and is significantly more robust to noise and under-sampling.
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
会议地点	Santiago, Chile
会议日期	7-13 Dec. 2015
URL	查看原文
收录类别	CPCI ; EI
语种	英语
资助项目	National Science Foundation[IIS-1422477]
WOS研究方向	Computer Science
WOS类目	Computer Science, Artificial Intelligence
WOS记录号	WOS:000380414100386
出版者	IEEE
EI入藏号	20162502506719
EI主题词	Iterative methods
EI分类号	Computer Applications:723.5 ; Numerical Methods:921.6
原始文献类型	Proceedings Paper
来源库	IEEE
引用统计	正在获取...
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2301
专题	信息科学与技术学院_PI研究组_虞晶怡组
通讯作者	Lin, Haiting
作者单位	1.Univ Delaware, Newark, DE 19716 USA 2.Microsoft Res, Greater Seattle, WA USA 3.ShanghaiTech Univ, Shanghai, Peoples R China
推荐引用方式 GB/T 7714	Lin, Haiting,Chen, Can,Kang, Sing Bing,et al. Depth Recovery from Light Field Using Focal Stack Symmetry[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2015:3451-3459.