ShanghaiTech University Knowledge Management System
| Resolving Scale Ambiguity Via XSlit Aspect Ratio Analysis | |
| 2015 | |
| Source Publication | 2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV)
 |
| ISSN | 2380-7504 |
| Volume | 2015 International Conference on Computer Vision, ICCV 2015 |
| Pages | 3424-3432 |
| Status | 已发表 |
| DOI | 10.1109/ICCV.2015.391 |
| Abstract | In perspective cameras, images of a frontal-parallel 3D object preserve its aspect ratio invariant to its depth. Such an invariance is useful in photography but is unique to perspective projection. In this paper, we show that alternative non-perspective cameras such as the crossed-slit or XSlit cameras exhibit a different depth-dependent aspect ratio (DDAR) property that can be used to 3D recovery. We first conduct a comprehensive analysis to characterize DDAR, infer object depth from its AR, and model recoverable depth range, sensitivity, and error. We show that repeated shape patterns in real Manhattan World scenes can be used for 3D reconstruction using a single XSlit image. We also extend our analysis to model slopes of lines. Specifically, parallel 3D lines exhibit depth-dependent slopes (DDS) on their images which can also be used to infer their depths. We validate our analyses using real XSlit cameras, XSlit panoramas, and catadioptric mirrors. Experiments show that DDAR and DDS provide important depth cues and enable effective single-image scene reconstruction. |
| Publication Place | 345 E 47TH ST, NEW YORK, NY 10017 USA |
| Conference Place | Santiago, Chile |
| Conference Date | 7-13 Dec. 2015 |
| URL | 查看原文 |
| Indexed By | CPCI ; EI |
| Language | 英语 |
| WOS Research Area | Computer Science |
| WOS Subject | Computer Science, Artificial Intelligence |
| WOS ID | WOS:000380414100383 |
| Publisher | IEEE |
| EI Accession Number | 20162502506731 |
| EI Keywords | Cameras ; Computer vision ; Image processing ; Image reconstruction |
| EI Classification Number | Computer Applications:723.5 ; Photographic Equipment:742.2 |
| WOS Keyword | SINGLE IMAGE ; CAMERA |
| Original Document Type | Proceedings Paper |
| Source Data | IEEE |
| Citation statistics | |
| Document Type | 会议论文 |
| Identifier | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2299 |
| Collection | 信息科学与技术学院_PI研究组_虞晶怡组 |
| Corresponding Author | Yang, Wei |
| Affiliation | 1.Univ Delaware, Newark, DE 19716 USA 2.Microsoft Res, Greater Seattle, WA USA 3.ShanghaiTech Univ, Shanghai, Peoples R China |
| Recommended Citation GB/T 7714 | Yang, Wei,Lin, Haiting,Kang, Sing Bing,et al. Resolving Scale Ambiguity Via XSlit Aspect Ratio Analysis[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2015:3424-3432. |
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