Measurement of the electronic structure of a type-II topological Dirac semimetal candidate VAl3 using angle-resolved photoelectron spectroscopy

doi:10.1007/s42864-022-00141-w

	Measurement of the electronic structure of a type-II topological Dirac semimetal candidate VAl3 using angle-resolved photoelectron spectroscopy
	Fang, Hong-Wei1,2 ; Liang, Ai-Ji1,3 ; Schröter, Niels B. M.4; Cui, Sheng-Tao 5; Liu, Zhong-Kai1,3 ; Chen, Yu-Lin1,3,6
	2022
发表期刊	TUNGSTEN (IF:5.6[JCR-2023],5.5[5-Year])
ISSN	2661-8028
EISSN	2661-8036
卷号	5 期号:3 页码:332-338
发表状态	已发表
DOI	10.1007/s42864-022-00141-w
摘要	Type-II topological Dirac semimetals are topological quantum materials hosting Lorentz-symmetry breaking type-II Dirac fermions, which are tilted Dirac cones with various exotic physical properties, such as anisotropic chiral anomalies and novel quantum oscillations. Until now, only limited material systems have been confirmed by theory and experiments with the type-II Dirac fermions. Here, we investigated the electronic structure of a new type-II Dirac semimetal VAl3 with angle-resolved photoelectron spectroscopy. The measured band dispersions are consistent with the theoretical prediction, which suggests the Dirac points are located close to (at about 100 meV above) the Fermi level. Our work demonstrates a new type-II Dirac semimetal candidate system with different Dirac node configurations and application potentials. © 2022, The Nonferrous Metals Society of China.
关键词	Aluminum alloys Photoelectron spectroscopy Photoelectrons Photons Topology Angle resolved photoelectron spectroscopy Chiral anomaly Dirac cones Dirac fermions Dirac semimetal Electronic.structure K evaporation Lorentz symmetry breaking Measurements of Type II
收录类别	EI ; ESCI
语种	英语
出版者	Springer
EI入藏号	20222112150639
EI主题词	Electronic structure
EI分类号	541.2 Aluminum Alloys ; 711 Electromagnetic Waves ; 921.4 Combinatorial Mathematics, Includes Graph Theory, Set Theory ; 931.3 Atomic and Molecular Physics
原始文献类型	Article in Press
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/187916
专题	物质科学与技术学院物质科学与技术学院_PI研究组_柳仲楷组物质科学与技术学院_特聘教授组_陈宇林物质科学与技术学院_博士生物质科学与技术学院_公共科研平台_拓扑物理实验室
通讯作者	Liu, Zhong-Kai
作者单位	1.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China; 2.University of Chinese Academy of Sciences, Beijing; 100049, China; 3.ShanghaiTech Laboratory for Topological Physics, ShanghaiTech University, Shanghai; 201210, China; 4.Max Planck Institute of Microstructure Physics, Halle; 06120, Germany; 5.National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei; 230029, China; 6.Department of Physics, University of Oxford, Oxford; OX1 3PU, United Kingdom
第一作者单位	物质科学与技术学院
通讯作者单位	物质科学与技术学院; 上海科技大学
第一作者的第一单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Fang, Hong-Wei,Liang, Ai-Ji,Schröter, Niels B. M.,et al. Measurement of the electronic structure of a type-II topological Dirac semimetal candidate VAl3 using angle-resolved photoelectron spectroscopy[J]. TUNGSTEN,2022,5(3):332-338.
APA	Fang, Hong-Wei,Liang, Ai-Ji,Schröter, Niels B. M.,Cui, Sheng-Tao,Liu, Zhong-Kai,&Chen, Yu-Lin.(2022).Measurement of the electronic structure of a type-II topological Dirac semimetal candidate VAl3 using angle-resolved photoelectron spectroscopy.TUNGSTEN,5(3),332-338.
MLA	Fang, Hong-Wei,et al."Measurement of the electronic structure of a type-II topological Dirac semimetal candidate VAl3 using angle-resolved photoelectron spectroscopy".TUNGSTEN 5.3(2022):332-338.