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Stereo Point Cloud Refinement for 3D Object Detection
2021
会议录名称2021 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2021) & 2021 IEEE CONFERENCE ON POSTGRADUATE RESEARCH IN MICROELECTRONICS AND ELECTRONICS (PRIMEASIA 2021)
发表状态已发表
DOI10.1109/APCCAS51387.2021.9687783
摘要

3D object detection has shown advantages over its 2D image based counterpart. This paper proposed a new pipeline to utilize the left and right consistence check on disparity map for stereo point clouds-based 3D object detection. Unlike existing pipeline directly project the depth map to the 3D space, the proposed pipeline first use the left and right consistence to filter out the bad pixels in the disparity map before the projection to stereo point clouds. Experimental results show that by eliminating those bad points, the proposed pipeline can achieve better performance in 3D object detection tasks. Moreover, due to the reduced number of points, the computation cost of 3D object detection can be significantly reduced.

关键词Stereo point cloud 3D object detection left and right consistence
会议名称IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) / IEEE Conference on Postgraduate Research in Microelectronics and Electronics (PRIMEASIA)
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
会议地点null,null,ELECTR NETWORK
会议日期NOV 22-26, 2021
URL查看原文
收录类别EI ; CPCI ; CPCI-S
语种英语
WOS研究方向Computer Science ; Telecommunications
WOS类目Computer Science, Information Systems ; Computer Science, Theory & Methods ; Telecommunications
WOS记录号WOS:000791022500015
出版者IEEE
来源库IEEE
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/183433
专题信息科学与技术学院_PI研究组_娄鑫组
信息科学与技术学院_硕士生
通讯作者Liu, Wangchao
作者单位
1.ShanghaiTech Univ, Shanghai, Peoples R China
2.Shanghai Inst Space Power, Shanghai, Peoples R China
3.Zhejiang Univ, Hangzhou, Zhejiang, Peoples R China
4.Shanghai Engn Res Ctr Energy Efficient & Custom A, Shanghai, Peoples R China
第一作者单位上海科技大学
通讯作者单位上海科技大学
第一作者的第一单位上海科技大学
推荐引用方式
GB/T 7714
Liu, Wangchao,Wang, Teng,Wang, Yang,et al. Stereo Point Cloud Refinement for 3D Object Detection[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2021.
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