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ShanghaiTech University Knowledge Management System
Abnormal strain in suspended GeSn microstructures | |
2018-03 | |
发表期刊 | MATERIALS RESEARCH EXPRESS (IF:1.8[JCR-2023],1.9[5-Year]) |
ISSN | 2053-1591 |
卷号 | 5期号:3 |
发表状态 | 已发表 |
DOI | 10.1088/2053-1591/aaafec |
摘要 | A suspended GeSn microstructure is realized by a two-step selective wet etching technique with the aim of fully relaxing the compressive strain, promoting the indirect to direct bandgap transition and improving the optical property of GeSn thin films grown on Ge. The compressive strain was found efficiently relaxed, and even unexpected large tensile strain was displayed on regions of the microstructure by micro-Raman spectroscopy. Residual Ge patches under the suspended GeSn microstructure were found by scanning electron microscopy and proved to be the origin of the tensile strain by finite element method simulations. The tensile strain on the surface is beneficial for direct bandgap conversion and carrier accumulation. Significant enhancement of photoluminescence was obtained in the GeSn microstructures than the original thin film. |
关键词 | GeSn microstructure FEM mu-Raman strain engineering silicon photonics PL |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
资助项目 | Chinese Academy of Sciences[KGZD-EW-804] |
WOS研究方向 | Materials Science |
WOS类目 | Materials Science, Multidisciplinary |
WOS记录号 | WOS:000426742100001 |
出版者 | IOP PUBLISHING LTD |
EI入藏号 | 20191306681412 |
EI主题词 | Energy gap ; Finite element method ; Microstructure ; Optical properties ; Scanning electron microscopy ; Semiconductor alloys ; Silicon photonics ; Thin films ; Tin alloys ; Wet etching |
EI分类号 | Tin and Alloys:546.2 ; Light/Optics:741.1 ; Numerical Methods:921.6 ; Mechanics:931.1 ; Materials Science:951 |
WOS关键词 | RAMAN-SCATTERING ; WAVE-GUIDES ; GERMANIUM ; SI ; INTERCONNECTS ; FABRICATION ; ROUTE |
原始文献类型 | Article |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/18296 |
专题 | 物质科学与技术学院 信息科学与技术学院_特聘教授组_王庶民组 物质科学与技术学院_硕士生 物质科学与技术学院_博士生 |
通讯作者 | Li, Yaoyao; Wang, Shumin |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100190, Peoples R China 3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China 4.Chinese Acad Sci, Shanghai Inst Tech Phys, State Key Lab Infrared Phys, 500 Yutian Rd, Shanghai 200083, Peoples R China 5.Chalmers Univ Technol, Dept Microtechnol & Nanosci, S-41296 Gothenburg, Sweden |
通讯作者单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Han, Yi,Song, Yuxin,Chen, Xiren,et al. Abnormal strain in suspended GeSn microstructures[J]. MATERIALS RESEARCH EXPRESS,2018,5(3). |
APA | Han, Yi.,Song, Yuxin.,Chen, Xiren.,Zhang, Zhenpu.,Liu, Juanjuan.,...&Wang, Shumin.(2018).Abnormal strain in suspended GeSn microstructures.MATERIALS RESEARCH EXPRESS,5(3). |
MLA | Han, Yi,et al."Abnormal strain in suspended GeSn microstructures".MATERIALS RESEARCH EXPRESS 5.3(2018). |
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