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Mechanical Impacts of Random Defects in Monolayer MoS2 by Stochastic Finite Element Modeling
期刊论文
ACS APPLIED NANO MATERIALS, 2025, 卷号: 8, 期号: 8
作者:
Chu, Liu
;
de Cursi, Eduardo Souza
;
Ji, Qingqing
收藏
|
浏览/下载:41/0
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提交时间:2025/02/28
Layered semiconductors
Molybdenum disulfide
Stochastic models
Equivalent elastic modulus
Finite element modelling (FEM)
Mechanical impacts
Mechanical reliability
MoS 2
Property
Stochastic finite element model
Stochastic finite elements
Sulfur vacancies
Two-dimensional materials
Measurement Guidance in Diffusion Models: Insight from Medical Image Synthesis
期刊论文
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2024, 卷号: 46, 期号: 12
作者:
Luo, Yimin
;
Yang, Qinyu
;
Fan, Yuheng
;
Qi, Haikun
;
Xia, Menghan
Adobe PDF(9618Kb)
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浏览/下载:250/4
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提交时间:2024/05/20
Task analysis
Medical diagnostic imaging
Uncertainty
Image synthesis
Training
Reliability
Data models
Diffusion models
measurement
uncertainty guidance
medical image synthesis
controllable generation
Development and validation of the Out-of-Hospital Adherence Questionnaire for Stroke Patients (OHAQ-SP)
期刊论文
BMC NEUROLOGY, 2024, 卷号: 24, 期号: 1
作者:
Sun, Hui Jun
;
Wu, Mei Ting
;
Qu, Jiayan
;
Lu, Jianping
Adobe PDF(1313Kb)
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收藏
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浏览/下载:127/28
|
提交时间:2024/12/17
Validation
Stroke
Adherence
Scale
Validity
Reliability
Applications and Concerns of ChatGPT and Other Conversational Large Language Models in Health Care: Systematic Review
期刊论文
JOURNAL OF MEDICAL INTERNET RESEARCH, 2024, 卷号: 26, 页码: e22769
作者:
Wang, Leyao
;
Wan, Zhiyu
;
Ni, Congning
;
Song, Qingyuan
;
Li, Yang
Adobe PDF(750Kb)
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收藏
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浏览/下载:240/2
|
提交时间:2024/12/16
large language model
ChatGPT
artificial intelligence
natural language processing
health care
summarization
medical knowledge inquiry
reliability
bias
privacy
Spatial and Modal Optimal Transport for Fast Cross-Modal MRI Reconstruction
期刊论文
IEEE TRANSACTIONS ON MEDICAL IMAGING, 2024, 卷号: 43, 期号: 11
作者:
Wang, Qi
;
Wen, Zhijie
;
Shi, Jun
;
Wang, Qian
;
Shen, Dinggang
Adobe PDF(27849Kb)
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收藏
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浏览/下载:293/7
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提交时间:2024/06/03
Image reconstruction
Magnetic resonance imaging
Task analysis
Manifolds
Deep learning
Transformers
Reliability
MRI reconstruction
cross-modal reconstruction
spatial alignment
optimal transport
Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization
期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 卷号: 29, 期号: 5
作者:
Chen, Tinghuan
;
Geng, Hao
;
Sun, Qi
;
Wan, Sanping
;
Sun, Yongsheng
Adobe PDF(25Kb)
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浏览/下载:288/29
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提交时间:2024/10/25
Analog circuits
aging
reliability
machine learning
Model checking-based decision support system for fault management: A comprehensive framework and application in electric power systems
期刊论文
EXPERT SYSTEMS WITH APPLICATIONS, 2024, 卷号: 247, 期号: 123371
作者:
Chen, Guangyao
;
He, Peilin
;
Wang, Ziqi
;
Teng, Zixin
;
Jiang, Zhihao
Adobe PDF(2200Kb)
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收藏
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浏览/下载:400/4
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提交时间:2024/02/23
Automata theory
Decision making
Electric power systems
Failure analysis
Intelligent agents
Model checking
Multi agent systems
Fault identifications
Fault management
Inter-agent interactions
Models checking
Partial observability
Reliability and safeties
Rigorous solution
System reliability
System safety
Timed Automata
Partially coupled transmission line fault location using single-ended measurements
期刊论文
ELECTRIC POWER SYSTEMS RESEARCH, 2024, 卷号: 233, 页码: 110496
作者:
Duan, Mengzhao
;
Ye, Aoshuang
;
Liu, Yu
Adobe PDF(7005Kb)
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收藏
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浏览/下载:352/2
|
提交时间:2024/06/11
Electric fault location
Electric lines
Electric power transmission
Iterative methods
Parameter estimation
Coupled transmission line
Distributed-parameter model
Location technology
Partially coupled transmission line
Power supply reliability
Single-ended
Single-ended fault locations
Single-ended measurement
Speed up
Transmission line fault location
Iterative Model Checking for Safety-Critical Problems in Cyber-Physical Systems
会议论文
2024 ACM/IEEE 15TH INTERNATIONAL CONFERENCE ON CYBER-PHYSICAL SYSTEMS (ICCPS), Hong Kong, Hong Kong, 13-16 May 2024
作者:
Guangyao Chen
;
Zhihao Jiang
Adobe PDF(971Kb)
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收藏
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浏览/下载:264/3
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提交时间:2024/07/08
Cyber Physical System
Embedded systems
Failure analysis
Fault detection
High level languages
Iterative methods
Model checking
Reliability analysis
Risk analysis
Risk assessment
Safety engineering
Case-studies
Critical problems
Cybe-physical systems
Cyber-physical systems
Faults diagnosis
Interactive tutorials
Iterative model
Models checking
Python package
Safety critical systems
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:
Yu Zhang
;
Renqiang Zhu
;
Haolan Qu
;
Yitian Gu
;
Huaxing Jiang
Adobe PDF(1470Kb)
|
收藏
|
浏览/下载:290/0
|
提交时间:2024/06/11
Activation energy
Deep level transient spectroscopy
Dielectric materials
Drain current
Electric fields
Gallium nitride
High electron mobility transistors
III-V semiconductors
MOSFET devices
Stability
Threshold voltage
Current collapse
Dynamic reliability assessment
Dynamics characteristic
Dynamics stability
MOS-FET
MOSFETs
Reference devices
Time resolved measurement
Trench MOSFET
Vertical trench MOSFET
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