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Neutral Beam Etching Enabled Recessed-Gate Emode GaN MOSHEMT: A Multi-Vth Power Device Platform for All-GaN Monolithic Integration 会议论文
INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS
作者:  Han Gao;  Yitian Gu;  Yudong Li;  Xuanling Zhou;  Haodong Jiang
Adobe PDF(1101Kb)  |  收藏  |  浏览/下载:61/3  |  提交时间:2025/03/03
Ion Beam Etching Enabled Recessed-Gate E-mode GaN MOS-HEMT with FOM of 701 MW·cm-2 and Monolithic Integrated Digital Circuit 会议论文
ASIA-PACIFIC WORKSHOP ON WIDEGAP SEMICONDUCTORS, Busan,Korea, 2024.10.13-2024.10.17
作者:  Han Gao;  Yitian Gu;  Yitai Zhu;  Wenbo Ye;  Xinbo Zou
Adobe PDF(422Kb)  |  收藏  |  浏览/下载:292/12  |  提交时间:2024/09/27
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