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Characterization results of the first full-scale readout HYLITE chip for STARLIGHT
期刊论文
JOURNAL OF INSTRUMENTATION, 2025, 卷号: 20, 期号: 2
作者:
Jia,Xining
;
Li,Mujin
;
Wei,Wei
;
Zhang,Jie
;
Jiang,Xiaoshan
Adobe PDF(3256Kb)
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收藏
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浏览/下载：121/15
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提交时间：2025/03/10
Cerenkov counters - Hadrons - Hybrid integrated circuits - Particle beams - Photons - Research laboratories - Semiconductor detectors - X ray detectors
Array detectors - Dynamic range - Free-electron lasers - Hybrid detectors - Instrumentation for FEL - Performance - Pixelated detector and associated VLSI electronic - Pixelated detectors - VLSI electronics - X-ray detector
Design of the first full-scale HYLITE, a charge integration pixel detector readout chip for XFEL
期刊论文
JOURNAL OF INSTRUMENTATION, 2024, 卷号: 19, 期号: 12
作者:
Li, M.
;
Wei, W.
;
Zhang, J.
;
Jiang, X.
;
Ju, X.
Adobe PDF(2504Kb)
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收藏
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浏览/下载：161/8
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提交时间：2025/01/10
CMOS integrated circuits
Hadrons
Integrated circuit design
Linear accelerators
Particle beams
Particle detectors
Photoelectrons
Photons
Positive ions
Pulse repetition rate
Detector readout
Frame-rate
Front end
Front-end electronic for detector readout
Pixel detector
Pixelated detector and associated VLSI electronic
Pixelated detectors
Readout chips
VLSI electronics
X-ray detector
Optimized design and characterization of HYLITE, a charge-integration readout chip of XFEL
期刊论文
JOURNAL OF INSTRUMENTATION, 2024, 卷号: 19, 期号: 4
作者:
Li, M.
;
Wei, W.
;
Jiang, X.
;
Zhang, J.
;
Li, X.
Adobe PDF(2361Kb)
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浏览/下载：187/0
|
提交时间：2024/04/26
Electrons
Free electron lasers
Integrated circuit design
Particle beams
Readout systems
Signal to noise ratio
Specifications
VLSI circuits
X ray detectors
Data interfaces
Detector readout
Front end
Front-end electronic for detector readout
Optimized designs
Pixelated detector and associated VLSI electronic
Pixelated detectors
Readout chips
VLSI electronics
X-ray detector
Boosting VLSI Design Flow Parameter Tuning with Random Embedding and Multi-objective Trust-region Bayesian Optimization
期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2023, 卷号: 28, 期号: 5
作者:
Zheng, Su
;
Geng, Hao
;
Bai, Chen
;
Yu, Bei
Adobe PDF(1432Kb)
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收藏
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浏览/下载：252/1
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提交时间：2023/10/13
Computational complexity
Computer aided design
Integrated circuit design
Multiobjective optimization
Tuning
VLSI circuits
Bayesian optimization
Design flows
Embeddings
Multi objective
Parameters tuning
Physical design
Runtimes
Trust region
Very large scale integration designs
Very large-scale integration design flow
A charge-integration pixel readout chip features IR-drop effect mitigation by distributed LDOs
期刊论文
JOURNAL OF INSTRUMENTATION, 2022, 卷号: 17, 期号: 9
作者:
Li, M.
;
Wei, W.
;
Jiang, X.
;
Cui, S.
;
Zhang, J.
Adobe PDF(2758Kb)
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浏览/下载：143/1
|
提交时间：2022/11/04
Drops
Electrons
Memory architecture
Readout systems
VLSI circuits
Voltage regulators
X ray detectors
High dynamic range
Instrumentation for FEL
IR drop
Low dropout regulator
Pixel arrays
Pixelated detector and associated VLSI electronic
Pixelated detectors
Readout chips
VLSI electronics
X-ray detector
Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion
期刊论文
JOURNAL OF INSTRUMENTATION, 2022, 卷号: 17, 期号: 1
作者:
Li, M.
;
Wei, W.
;
Jiang, X.
;
Cui, S.
Adobe PDF(12205Kb)
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收藏
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浏览/下载：277/2
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提交时间：2022/02/13
Analog to digital conversion
Electrons
Free electron lasers
Integrated circuit design
Readout systems
VLSI circuits
X ray detectors
Detector readout
Dynamic range
Frame-rate
Instrumentation for FEL
Pixelated detector and associated VLSI electronic
Pixelated detectors
Prototype chip
Readout chips
VLSI electronics
X-ray detector
Tolerating Stuck-at Fault and Variation in Resistive Edge Inference Engine via Weight Mapping
会议论文
PROCEEDINGS OF THE ACM GREAT LAKES SYMPOSIUM ON VLSI, GLSVLSI, Virtual, Online, United states, June 22, 2021 - June 25, 2021
作者:
Ma, Yu
;
Zheng, Linfeng
;
Zhou, Pingqiang
Adobe PDF(1864Kb)
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浏览/下载：449/0
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提交时间：2021/12/17
Mapping
Memristors
Reliability analysis
VLSI circuits-0-1 programming problem
Crossbar arrays
Mapping method
Memristor
Network inference
Reliability problems
Stuck-at faults
Weight distributions
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