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Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion | |
2022-01 | |
发表期刊 | JOURNAL OF INSTRUMENTATION (IF:1.3[JCR-2023],1.3[5-Year]) |
ISSN | 1748-0221 |
EISSN | 1748-0221 |
卷号 | 17期号:1 |
发表状态 | 已发表 |
DOI | 10.1088/1748-0221/17/01/P01003 |
摘要 | HYLITE (High dYmamic range free electron Laser Imaging deTEctor) is a hybrid pixel detector readout chip, which is designed for advanced light sources such as X-ray Free Electron Laser (XFEL) and diffraction-limited storage rings. It is a charge-integration readout chip which has three gains for different dynamic ranges and automatic gain-switching function. The full dynamic range covered by HYLITE is 1 ∼ 104 photons with an energy of 12 keV for each pixel in every shot. In-pixel ADC is designed to achieve front-end digitization and a 10 kHz continuous frame rate. HYLITE0.1 is the first prototype chip for functional verification that was produced in CMOS 0.13 μm technology. It consists of a pixel array with 6 12 pixels and a periphery with full standalone operation features. The size of each pixel is 200 μm 200 μm. Three design variations of pixels with different integrating capacitance and structures were designed to optimize between area and performance. A 10-bit Wilkinson ADC is integrated in each pixel to digitize the outputs of the pre-amplifier. Therefore, analog signal transmission of long distance is avoided and a frame rate of 10 kHz can be achieved. In this paper, we present the design of HYLITE0.1 and the test results of this prototype chip. © 2022 IOP Publishing Ltd and Sissa Medialab. |
关键词 | Analog to digital conversion Electrons Free electron lasers Integrated circuit design Readout systems VLSI circuits X ray detectors Detector readout Dynamic range Frame-rate Instrumentation for FEL Pixelated detector and associated VLSI electronic Pixelated detectors Prototype chip Readout chips VLSI electronics X-ray detector |
URL | 查看原文 |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
资助项目 | Scientific Instrument Developing Project of the Chinese Acadamy of Sciences[ZDKYYQ20200007] ; State Key Laboratory of Paricle Detection and Eletronics[SKLPDE-ZZ-202002] ; Youth Inovation Promotion Association of the Chinese Acadamy of Sciences[Y201905] |
WOS研究方向 | Instruments & Instrumentation |
WOS类目 | Instruments & Instrumentation |
WOS记录号 | WOS:000757042500005 |
出版者 | IOP Publishing Ltd |
EI入藏号 | 20220511563210 |
EI主题词 | Pixels |
EI分类号 | 714.2 Semiconductor Devices and Integrated Circuits ; 744.5 Free Electron Lasers |
原始文献类型 | Journal article (JA) |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/153596 |
专题 | 物质科学与技术学院_博士生 |
通讯作者 | Wei, W. |
作者单位 | 1.State Key Lab Particle Detect & Elect China, 19 B Yuquan Rd, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst High Energy Phys, 19 B Yuquan Rd, Beijing 100049, Peoples R China 3.Univ Chinese Acad Sci, 19 A Yuquan Rd, Beijing 100049, Peoples R China 4.ShanghaiTech Univ, Ctr Transformat Sci, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China 5.ShanghaiTech Univ, Sch Phys Sci & Technol, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China |
推荐引用方式 GB/T 7714 | Li, M.,Wei, W.,Jiang, X.,et al. Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion[J]. JOURNAL OF INSTRUMENTATION,2022,17(1). |
APA | Li, M..,Wei, W..,Jiang, X..,Cui, S..,Zhang, J..,...&Liu, Z..(2022).Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion.JOURNAL OF INSTRUMENTATION,17(1). |
MLA | Li, M.,et al."Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion".JOURNAL OF INSTRUMENTATION 17.1(2022). |
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