Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion
2022-01
发表期刊JOURNAL OF INSTRUMENTATION (IF:1.3[JCR-2023],1.3[5-Year])
ISSN1748-0221
EISSN1748-0221
卷号17期号:1
发表状态已发表
DOI10.1088/1748-0221/17/01/P01003
摘要

HYLITE (High dYmamic range free electron Laser Imaging deTEctor) is a hybrid pixel detector readout chip, which is designed for advanced light sources such as X-ray Free Electron Laser (XFEL) and diffraction-limited storage rings. It is a charge-integration readout chip which has three gains for different dynamic ranges and automatic gain-switching function. The full dynamic range covered by HYLITE is 1 ∼ 104 photons with an energy of 12 keV for each pixel in every shot. In-pixel ADC is designed to achieve front-end digitization and a 10 kHz continuous frame rate. HYLITE0.1 is the first prototype chip for functional verification that was produced in CMOS 0.13 μm technology. It consists of a pixel array with 6 12 pixels and a periphery with full standalone operation features. The size of each pixel is 200 μm 200 μm. Three design variations of pixels with different integrating capacitance and structures were designed to optimize between area and performance. A 10-bit Wilkinson ADC is integrated in each pixel to digitize the outputs of the pre-amplifier. Therefore, analog signal transmission of long distance is avoided and a frame rate of 10 kHz can be achieved. In this paper, we present the design of HYLITE0.1 and the test results of this prototype chip. © 2022 IOP Publishing Ltd and Sissa Medialab.

关键词Analog to digital conversion Electrons Free electron lasers Integrated circuit design Readout systems VLSI circuits X ray detectors Detector readout Dynamic range Frame-rate Instrumentation for FEL Pixelated detector and associated VLSI electronic Pixelated detectors Prototype chip Readout chips VLSI electronics X-ray detector
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收录类别SCI ; SCIE ; EI
语种英语
资助项目Scientific Instrument Developing Project of the Chinese Acadamy of Sciences[ZDKYYQ20200007] ; State Key Laboratory of Paricle Detection and Eletronics[SKLPDE-ZZ-202002] ; Youth Inovation Promotion Association of the Chinese Acadamy of Sciences[Y201905]
WOS研究方向Instruments & Instrumentation
WOS类目Instruments & Instrumentation
WOS记录号WOS:000757042500005
出版者IOP Publishing Ltd
EI入藏号20220511563210
EI主题词Pixels
EI分类号714.2 Semiconductor Devices and Integrated Circuits ; 744.5 Free Electron Lasers
原始文献类型Journal article (JA)
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/153596
专题物质科学与技术学院_博士生
通讯作者Wei, W.
作者单位
1.State Key Lab Particle Detect & Elect China, 19 B Yuquan Rd, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Inst High Energy Phys, 19 B Yuquan Rd, Beijing 100049, Peoples R China
3.Univ Chinese Acad Sci, 19 A Yuquan Rd, Beijing 100049, Peoples R China
4.ShanghaiTech Univ, Ctr Transformat Sci, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China
5.ShanghaiTech Univ, Sch Phys Sci & Technol, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China
推荐引用方式
GB/T 7714
Li, M.,Wei, W.,Jiang, X.,et al. Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion[J]. JOURNAL OF INSTRUMENTATION,2022,17(1).
APA Li, M..,Wei, W..,Jiang, X..,Cui, S..,Zhang, J..,...&Liu, Z..(2022).Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion.JOURNAL OF INSTRUMENTATION,17(1).
MLA Li, M.,et al."Prototype characterization of a charge-integration pixel detector readout chip with in-pixel A/D conversion".JOURNAL OF INSTRUMENTATION 17.1(2022).
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