消息
×
loading..
×
验证码:
换一张
忘记密码?
记住我
×
统一认证登录
登录
中文版
|
English
上海科技大学知识管理系统
ShanghaiTech University Knowledge Management System
统一认证登录
登录
注册
ALL
ORCID
题名
作者
发表日期
关键词
文献类型
DOI
出处
存缴日期
收录类别
出版者
学习讨论厅
图片搜索
粘贴图片网址
首页
研究单元&专题
作者
文献类型
学科分类
知识图谱
知识整合
学习讨论厅
在结果中检索
研究单元&专题
信息科学与技术学院 [2]
大科学中心 [2]
作者
叶朝锋 [2]
李一凡 [2]
肖奇 [2]
类维政 [2]
冯嘉瑞 [1]
文献类型
会议论文 [2]
期刊论文 [2]
发表日期
2025 [2]
2024 [2]
出处
2024 ACADE... [1]
APPLIED OP... [1]
PROCEEDING... [1]
SENSORS [1]
语种
英语 [4]
资助项目
National K... [1]
null[52277... [1]
null[U23B2... [1]
资助机构
收录类别
EI [4]
SCI [2]
状态
已发表 [4]
×
知识图谱
KMS
反馈留言
浏览/检索结果:
共4条,第1-4条
帮助
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
期刊影响因子升序
期刊影响因子降序
题名升序
题名降序
提交时间升序
提交时间降序
WOS被引频次升序
WOS被引频次降序
发表日期升序
发表日期降序
Absolute interferometric shift-flip method for measuring X-ray mirrors
期刊论文
APPLIED OPTICS, 2025, 卷号: 64, 期号: 7, 页码: 1591-1597
作者:
Wang, Jiezhuo
;
Zhou, Guang
;
Lei, Weizheng
;
Dong, Xiaohao
;
Wang, Jie
Adobe PDF(2760Kb)
|
收藏
|
浏览/下载:66/1
|
提交时间:2025/03/18
Benchmarking
Interferometry
Laser mirrors
Strain measurement
X ray apparatus
Absolute measurements
Interferometrics
Least-squares- methods
Reference mirrors
Relative measurement
Shape matrixes
Shift-and
Surface shape
X ray mirrors
X-ray mirror surfaces
A Precise Oxide Film Thickness Measurement Method Based on Swept Frequency and Transmission Cable Impedance Correction
期刊论文
SENSORS, 2025, 卷号: 25, 期号: 2
作者:
Li, Yifan
;
Xiao, Qi
;
Peng, Lisha
;
Huang, Songling
;
Ye, Chaofeng
Adobe PDF(11827Kb)
|
收藏
|
浏览/下载:100/2
|
提交时间:2025/02/12
Electric frequency measurement
Electric impedance measurement
Mass spectrometry
Micrometers
Phase measurement
Process monitoring
Strain measurement
Thickness gages
Thickness measurement
Velocity measurement
Eddy current testing
Eddy-current testing
Film thickness measurement
Impedance correction
Oxide film thickness
Oxide film thickness measurement
Sweep frequencies
Swept-frequency
Transmission cables
Transmission line modeling
A Temperature Compensation Method for Micron Level Measurement of Oxide Film Thickness
会议论文
2024 ACADEMIC CONFERENCE OF CHINA INSTRUMENT AND CONTROL SOCIETY (ACCIS), Chengdu, China, 28-31 July 2024
作者:
Jiarui Feng
;
Xiaoguang Li
;
Guozheng Zhou
;
Yifan Li
;
Qi Xiao
Adobe PDF(2022Kb)
|
收藏
|
浏览/下载:48/1
|
提交时间:2025/04/14
Eddy current testing
Level measurement
Nuclear fuel cladding
Phase measurement
Strain measurement
Thickness gages
Thickness measurement
Velocity measurement
Compensation method
Eddy-current testing
Film thickness measurement
Fuel cladding
Measurements of
Micron level
Oxide film thickness
Oxide film thickness measurement
Pool-side inspection
Temperature compensation
High-accuracy mirror surface measurement using three scanning interferometric displacement sensors
会议论文
PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Nantong, China, October 12, 2024 - October 14, 2024
作者:
Wang, Jiezhuo
Adobe PDF(448Kb)
|
收藏
|
浏览/下载:144/5
|
提交时间:2024/12/27
Displacement measurement
Interferometers
Interferometry
Mirrors
Prisms
Strain measurement
Velocity measurement
Displacement sensor
High-accuracy
Interferometric displacement sensor
Interferometrics
Mirror metrology
Mirror surfaces
Motion errors
Optical Metrology
Surface height
X ray mirrors
首页
上一页
1
下一页
末页