ShanghaiTech University Knowledge Management System
High-accuracy mirror surface measurement using three scanning interferometric displacement sensors | |
2024 | |
会议录名称 | PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING |
ISSN | 0277-786X |
卷号 | 13241 |
发表状态 | 已发表 |
DOI | 10.1117/12.3045125 |
摘要 | High-accuracy mirror surface measurement using three scanning interferometric displacement sensors, with motion error calibrated, is proposed for X-ray mirror metrology. The motion error of the scanning displacement stage significantly affects the high-accuracy measurement of mirror surfaces during scanning. The influence of motion errors on surface height measurements is studied. After eliminating motion errors with a system comprising three scanning interferometric displacement sensors, the mirror surface can be obtained. The formula for the surface height solution is derived, and the residual error terms are analyzed. A method of error reduction using three reference mirrors to calibrate distance is proposed. The calibration and test experiments are conducted. Experimental results demonstrate the effectiveness of calibration, and the measurement repeatability is 7.39 nm. © 2024 SPIE. |
会议录编者/会议主办者 | Chinese Optical Society (COS) ; The Society of Photo-Optical Instrumentation Engineers (SPIE) |
关键词 | Displacement measurement Interferometers Interferometry Mirrors Prisms Strain measurement Velocity measurement Displacement sensor High-accuracy Interferometric displacement sensor Interferometrics Mirror metrology Mirror surfaces Motion errors Optical Metrology Surface height X ray mirrors |
会议名称 | Optical Metrology and Inspection for Industrial Applications XI 2024 |
会议地点 | Nantong, China |
会议日期 | October 12, 2024 - October 14, 2024 |
收录类别 | EI |
语种 | 英语 |
出版者 | SPIE |
EI入藏号 | 20245117563374 |
EI主题词 | Surface measurement |
EISSN | 1996-756X |
EI分类号 | 741.3 Optical Devices and Systems ; 941.2 Acoustic Variables Measurements ; 941.5 ; 942.1.3 ; 942.1.7 |
原始文献类型 | Conference article (CA) |
文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/461536 |
专题 | 大科学中心 |
通讯作者 | Wang, Jiezhuo; Dong, Xiaohao |
作者单位 | 1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai; 201800, China; 2.ShanghaiTech University, Shanghai; 201210, China; 3.Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai; 201210, China; 4.University of Chinese Academy of Sciences, Beijing; 100049, China |
推荐引用方式 GB/T 7714 | Wang, Jiezhuo,Zhou, Guang,Lei, Weizheng,et al. High-accuracy mirror surface measurement using three scanning interferometric displacement sensors[C]//Chinese Optical Society (COS), The Society of Photo-Optical Instrumentation Engineers (SPIE):SPIE,2024. |
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