Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser

doi:10.7498/aps.73.20240383

	Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser
其他题名	上海软 X 射线自由电子激光单脉冲成像定时的设计与实现
	Nie, Yong-Gan1,2 ; Gao, Zi-Chen2 ; Tong, Ya-Jun2 ; Fan, Jia-Dong2 ; Liu, Gong-Fa 1; Jiang, Huai-Dong 2
	2024-06
发表期刊	WULI XUEBAO/ACTA PHYSICA SINICA
ISSN	1000-3290
卷号	73 期号:12
发表状态	已发表
DOI	10.7498/aps.73.20240383
摘要	X-ray free-electron laser (XFEL), as a novel advanced X-ray light source, has excellent properties such as ultra-high brightness, ultra-shot pulse duration, and full coherence. The coherent X-ray diffraction imaging (CDI) has a lot of advantages at high resolution and quantitative imaging compared with the traditional lens based X-ray imaging methods. By combining the excellent properties of XFEL and advantages of CDI, the single-shot imaging has been realized, based on the concept of 'diffraction before destruction'. Shanghai soft X-ray free-electron laser facility (SXFEL) is the first XFEL facility operated at the X-ray wavelength in China. The coherent scattering and imaging (CSI) endstation is the first commissioned endstation at SXFEL, focusing on the high spatiotemporal imaging for nano materials and micro materials by using a single-shot imaging method. To realize the single-shot experiment at XFEL, especially for single-shot imaging, the timing system plays a crucial role in ensuring the operation of the equipment in sequence. This paper introduces the design and implementation process of SXFEL single-shot imaging timing. The timing system is implemented with White Rabbit (WR) and digital delay and pulse generator (BNC505). Single-shot imaging is realized by synchronously moving the sample scanning stages and X-ray shutter to select a single pulse to illuminate the sample. At the same time, the X-ray detector is triggered with the timing system to record the single-shot diffraction pattern. During debugging, a gold nanodisks each with a side length of approximately 300 nm and a thickness of about 30 nm, as test samples, are imaged at the CSI endstation. The nanodisks are uniformly dispersed on Si3N4 membranes for single-shot imaging. Because of the ultra-high peak intensity at the focus spot, the samples and membrane are ionized for each XFEL pulse shot. A raster scan is performed on the membranes at intervals of 50 μm to update the sample. With the timing system and X-ray shutter, single-shot diffraction patterns can be recorded by using an X-ray detector. From the image of the Si3N4 membrane after raster scanning, the ionized holes with an interval of 50 μm can be recognized. Finally, phase retrieval is applied to the single-shot diffraction pattern to obtain a real-space image of the sample. The resolution of the reconstructed image is estimated by calculating the phase-retrieval transfer function (PRTF). With a citation of the PRTF curve dropping below 1/e, the spatial frequency cutoff is determined to be 22.6 μm–1, corresponding to a half period resolution of 22.1 nm. The results show that the designed timing system can accurately control the time sequence of the imaging process, meeting the requirement for single-shot imaging within 50 Hz at SXFEL. © 2024 Chinese Physical Society.
关键词	Cesium iodide Coherent scattering Diffraction patterns Electrons Free electron lasers Interferometry Ionization Rasterization Scintillation counters Secondary emission Silicon compounds Silicon detectors Timing circuits X ray diffraction X ray optics X ray scattering Coherent X-ray diffraction imaging Design and implementations Laser facilities Phase retrieval Property Single-shot Single-shot imaging Soft-X-ray free-electron-laser Timing systems X-ray free electron lasers
URL	查看原文
收录类别	EI ; SCI
语种	中文
资助项目	National Key R&D Program of China[2022YFA1603703] ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB37040303] ; National Natural Science Foundation of China[12335020]
WOS研究方向	Physics
WOS类目	Physics, Multidisciplinary
WOS记录号	WOS:001251024200002
出版者	Institute of Physics, Chinese Academy of Sciences
EI入藏号	20242616442755
EI主题词	X ray detectors
EI分类号	711 Electromagnetic Waves ; 713.4 Pulse Circuits ; 723.2 Data Processing and Image Processing ; 723.5 Computer Applications ; 744.5 Free Electron Lasers ; 802.2 Chemical Reactions ; 804 Chemical Products Generally ; 932.1 High Energy Physics ; 941.4 Optical Variables Measurements ; 944.7 Radiation Measuring Instruments
原始文献类型	Journal article (JA)
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/395979
专题	大科学中心_公共科研平台_大科学装置建设部物质科学与技术学院_博士生
通讯作者	Fan, Jia-Dong; Jiang, Huai-Dong
作者单位	1.National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei; 230029, China 2.Center for Transformative Science, ShanghaiTech University, Shanghai; 201210, China
第一作者单位	上海科技大学
通讯作者单位	上海科技大学
推荐引用方式 GB/T 7714	Nie, Yong-Gan,Gao, Zi-Chen,Tong, Ya-Jun,et al. Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser[J]. WULI XUEBAO/ACTA PHYSICA SINICA,2024,73(12).
APA	Nie, Yong-Gan,Gao, Zi-Chen,Tong, Ya-Jun,Fan, Jia-Dong,Liu, Gong-Fa,&Jiang, Huai-Dong.(2024).Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser.WULI XUEBAO/ACTA PHYSICA SINICA,73(12).
MLA	Nie, Yong-Gan,et al."Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser".WULI XUEBAO/ACTA PHYSICA SINICA 73.12(2024).