An Edge-on GaAs:Cr Detector for Clinical Photon Counting CT

doi:10.1109/NSSMICRTSD49126.2023.10338578

	An Edge-on GaAs:Cr Detector for Clinical Photon Counting CT
	T. Zhong; W. Qin; X. Yu; X. Lai
	2023-11
会议录名称	2023 IEEE NUCLEAR SCIENCE SYMPOSIUM, MEDICAL IMAGING CONFERENCE AND INTERNATIONAL SYMPOSIUM ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS (NSS MIC RTSD)
ISSN	1082-3654
发表状态	已发表
DOI	10.1109/NSSMICRTSD49126.2023.10338578
摘要	This study proposes the an edge-on Cr-compensated GaAs (GaAs:Cr) detector for clinical photon counting CT applications. Compared to other semiconductors, such as CdZnTe (CZT) and Si, GaAs:Cr offers advantages such as high electron mobility, lower scattering ratio, and lower fabrication cost. The edge-on detector structure provides better detection efficiency compared to conventional horizontal structures. To evaluate the performance, a detector full-response model was developed and compared against edge-on Si and face-on CZT detectors. The results of the noise cloud index analysis demonstrates that the proposed GaAs:Cr detector exhibits a superior mono-energy spectrum and a lower bound of noise, as a potential alternative to photon counting detectors for clinical CT applications.
关键词	Semiconductor device modeling Microwave integrated circuits Semiconductor detectors Image edge detection Computed tomography Scattering Detectors
会议地点	Vancouver, BC, Canada
会议日期	4-11 Nov. 2023
URL	查看原文
来源库	IEEE
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/354914
专题	生物医学工程学院生命科学与技术学院_硕士生信息科学与技术学院_硕士生生物医学工程学院_PI研究组_赖晓春组生物医学工程学院_博士生
作者单位	School of Biomedical Engineering, ShanghaiTech University, Shanghai, China
第一作者单位	生物医学工程学院
第一作者的第一单位	生物医学工程学院
推荐引用方式 GB/T 7714	T. Zhong,W. Qin,X. Yu,et al. An Edge-on GaAs:Cr Detector for Clinical Photon Counting CT[C],2023.