Group Testing With Side Information via Generalized Approximate Message Passing

doi:10.1109/TSP.2023.3287671

	Group Testing With Side Information via Generalized Approximate Message Passing
	Cao, Shu-Jie1,2 ; Goenka, Ritesh 3; Wong, Chau-Wai 4; Rajwade, Ajit 5; Baron, Dror 4
	2023
发表期刊	IEEE TRANSACTIONS ON SIGNAL PROCESSING (IF:4.6[JCR-2023],5.2[5-Year])
ISSN	1053-587X
EISSN	1941-0476
卷号	71
发表状态	已发表
DOI	10.1109/TSP.2023.3287671
摘要	testing can help maintain a widespread testing program using fewer resources amid a pandemic. In a group testing setup, we are given n samples, one per individual. Each individual is either infected or uninfected. These samples are arranged into m < n pooled samples, where each pool is obtained by mixing a subset of the n individual samples. Infected individuals are then identified using a group testing algorithm. In this article, we incorporate side information (SI) collected from contact tracing (CT) into nonadaptive/single-stage group testing algorithms. We generate different types of CT SI data by incorporating different possible characteristics of the spread of disease. These data are fed into a group testing framework based on generalized approximate message passing (GAMP). Numerical results show that our GAMP-based algorithms provide improved accuracy.
关键词	Compressed sensing contact tracing generalized approximate message passing (GAMP) nonadaptive group testing
URL	查看原文
收录类别	SCI
语种	英语
资助项目	US National Science Foundation[ECCS-2030430] ; India's Science and Engineering Research Board (SERB) Matrics[10013890] ; IITB-WRCB (Wadhwani Center for Bioengineering)[DONWR04-002] ; DST-Rakshak[DST0000-005]
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:001025458300001
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
来源库	IEEE
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/321446
专题	信息科学与技术学院_本科生
通讯作者	Cao, Shu-Jie
作者单位	1.ShanghaiTech Univ, Shanghai 201210, Peoples R China 2.Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA 3.Indian Inst Technol, Mumbai 400076, India 4.NC State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA 5.Indian Inst Technol, Dept Comp Sci & Engn, Mumbai 400076, India
第一作者单位	上海科技大学
通讯作者单位	上海科技大学
第一作者的第一单位	上海科技大学
推荐引用方式 GB/T 7714	Cao, Shu-Jie,Goenka, Ritesh,Wong, Chau-Wai,et al. Group Testing With Side Information via Generalized Approximate Message Passing[J]. IEEE TRANSACTIONS ON SIGNAL PROCESSING,2023,71.
APA	Cao, Shu-Jie,Goenka, Ritesh,Wong, Chau-Wai,Rajwade, Ajit,&Baron, Dror.(2023).Group Testing With Side Information via Generalized Approximate Message Passing.IEEE TRANSACTIONS ON SIGNAL PROCESSING,71.
MLA	Cao, Shu-Jie,et al."Group Testing With Side Information via Generalized Approximate Message Passing".IEEE TRANSACTIONS ON SIGNAL PROCESSING 71(2023).