High-resolution Magnetic Imaging Probe with Staggered Sensor Arrays for Small Defects Inspection
2023
发表期刊IEEE SENSORS JOURNAL (IF:4.3[JCR-2023],4.2[5-Year])
ISSN1530-437X
EISSN1558-1748
卷号23期号:17页码:1-1
发表状态已发表
DOI10.1109/JSEN.2023.3294994
摘要

The earlier deficiencies are detected, the better the health and safety of an industrial structure can be maintained. To this aim, tools that can detect small defects are required. However, it is still a challenging problem to detect small defects economically and reliably. This paper presents a novel high-resolution magnetic field imaging probe with two rows of tunneling magnetoresistance (TMR) array sensors. The sensors are integrated on a printed circuit board by golden wire bonding technology. The probe outputs absolute and differential signals simultaneously. The distance between the centers of each two adjacent sensors in one row is 0.5 mm resulting in high spatial resolution magnetic field images. The two rows of sensors are placed with 0.25 mm offset and the differential outputs of the sensors are merged to further increase the image pixel pitch to 0.25 mm. The operating principle of the probe is studied based on a three-dimensional finite element method (FEM) model, and the feasibility of detection small defects using the probe is tested experimentally. The experimental results Show that a small defect with dimensions 1 mm (length)0.1 mm (width)0.1 mm (depth) can be detected by the probe. In addition, an image processing algorithm that employs the Gray-level Co-occurrence Matrix (GLCM) method is developed to reduce the noise in the image, which retains the large connection area of the texture features to extract the indications of defects. It is found that the probe has outstanding detection ability for small defects compared with current ECT array probes. IEEE

关键词Accident prevention Defects Image processing Image sensors Magnetic sensors Pressure sensors Printed circuit boards Probes Tunnelling magnetoresistance Array probe Coil Differential measurements Eddy-current testing High resolution Images processing Imaging probe Magnetoresistance sensors Sensitivity Sensors array
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收录类别SCI
语种英语
出版者Institute of Electrical and Electronics Engineers Inc.
EI入藏号20233014430772
EI主题词Eddy current testing
EI分类号701.2 Magnetism: Basic Concepts and Phenomena ; 723.2 Data Processing and Image Processing ; 914.1 Accidents and Accident Prevention ; 944.3 Pressure Measuring Instruments ; 951 Materials Science
原始文献类型Article in Press
来源库IEEE
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/317367
专题信息科学与技术学院
信息科学与技术学院_PI研究组_叶朝锋组
信息科学与技术学院_硕士生
信息科学与技术学院_博士生
作者单位
1.School of Information Science and Technology, Shanghai Engineering Research Center of Energy Efficient and Custom AI IC, ShanghaiTech University, Shanghai, China
2.China Nuclear Power Operation Technology Corporation Ltd., Wuhan, China
第一作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
推荐引用方式
GB/T 7714
Haoran Dong,Pan Qi,Jie Han,et al. High-resolution Magnetic Imaging Probe with Staggered Sensor Arrays for Small Defects Inspection[J]. IEEE SENSORS JOURNAL,2023,23(17):1-1.
APA Haoran Dong.,Pan Qi.,Jie Han.,Na Zhang.,Cai Long.,...&Chaofeng Ye.(2023).High-resolution Magnetic Imaging Probe with Staggered Sensor Arrays for Small Defects Inspection.IEEE SENSORS JOURNAL,23(17),1-1.
MLA Haoran Dong,et al."High-resolution Magnetic Imaging Probe with Staggered Sensor Arrays for Small Defects Inspection".IEEE SENSORS JOURNAL 23.17(2023):1-1.
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