Initial probe function construction in ptychography based on zone-plate optics

doi:10.1364/AO.487694

	Initial probe function construction in ptychography based on zone-plate optics
	Zeping Qin 1,2,3; Zijian Xu 1,2,3; Ruoru Li1,2,4 ; Haigang Liu 2; Shilei Liu1,2,4 ; Qingcao Wen 1,2; Xing Chen 1,2,3; Xiangzhi Zhang 1,2; Renzhong Tai 1,2,3
	2023-05-02
发表期刊	APPLIED OPTICS (IF:1.7[JCR-2023],1.7[5-Year])
ISSN	1559-128X
EISSN	2155-3165
卷号	62 期号:14 页码:3542-3550
发表状态	已发表
DOI	10.1364/AO.487694
摘要	X-ray ptychography is a popular variant of coherent diffraction imaging that offers ultrahigh resolution for extended samples. In x-ray ptychography instruments, the Fresnel zone-plate (FZP) is the most commonly used optical probe system for both soft x-ray and hard x-ray. In FZP-based ptychography with a highly curved defocus probe wavefront, the reconstructed image quality can be significantly impacted by the initial probe function form, necessitating the construction of a suitable initial probe for successful reconstruction. To investigate the effects of initial probe forms on FZP-based ptychography reconstruction, we constructed four single-mode initial probe models (IPMs) and three multi-mode IPMs in this study, and systematically compared their corresponding simulated and experimental reconstructions. The results show that the Fresnel IPM, spherical IPM, and Fresnel-based multi-mode IPMs can result in successful reconstructions for both near-focus and defocus cases, while random IPMs and constant IPMs work only for near-focus cases. Consequently, for FZP-based ptychography, the elaborately constructed IPMs that closely resemble real probes in wavefront phase form are more advantageous than natural IPMs such as the random or constant model. Furthermore, these IPMs with high phase similarity to the high-curvature large-sized probe adopted in experiments can help greatly improve ptychography experiment efficiency and decrease radiation damage to samples. © 2023 Optica Publishing Group.
关键词	Prisms Radiation damage Wavefronts X ray diffraction analysis Coherent diffraction imaging Defocus Extended samples Fresnel Fresnel zone plate Function construction Multimodes PROBE-model Ultrahigh resolution Zone plates
URL	查看原文
收录类别	SCI ; EI
语种	英语
出版者	Optica Publishing Group (formerly OSA)
EI入藏号	20243416919080
EI主题词	Probes
EI分类号	1001.3.2 ; 1301.4.1 ; 741.3 Optical Devices and Systems
原始文献类型	Journal article (JA)
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/299855
专题	物质科学与技术学院物质科学与技术学院_博士生
作者单位	1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China 2.Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China 3.University of Chinese Academy of Sciences, Beijing 100049, China 4.School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China
推荐引用方式 GB/T 7714	Zeping Qin,Zijian Xu,Ruoru Li,et al. Initial probe function construction in ptychography based on zone-plate optics[J]. APPLIED OPTICS,2023,62(14):3542-3550.
APA	Zeping Qin.,Zijian Xu.,Ruoru Li.,Haigang Liu.,Shilei Liu.,...&Renzhong Tai.(2023).Initial probe function construction in ptychography based on zone-plate optics.APPLIED OPTICS,62(14),3542-3550.
MLA	Zeping Qin,et al."Initial probe function construction in ptychography based on zone-plate optics".APPLIED OPTICS 62.14(2023):3542-3550.