A Cross-Layer Framework for Temporal Power and Supply Noise Prediction
2018
发表期刊IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (IF:2.7[JCR-2023],2.9[5-Year])
ISSN0278-0070
卷号38期号:99页码:1
发表状态已发表
DOI10.1109/TCAD.2018.2871820
摘要

In modern microprocessor and SoC designs, supply noise margin has been significantly reduced due to the continuously decreasing supply voltage level. On the other hand, with increasing current density, chips may see larger supply noise variations on various spots and from time to time. As a result, chip robustness and reliability are inevitably deteriorated with more frequent supply noise emergencies. It is therefore crucial to have an efficient supply noise prediction method to enhance design robustness. The state-of-art solutions either try to build a spatial noise estimation framework at the layout-level using the limited distributed physical noise sensors or attempt to develop emergency predictors at the architecture-level thus ignore back-end power delivery details In this paper, we propose a cross-layer framework for temporal supply noise prediction. Our method not only accounts for the temporal characteristics of workload execution at micro-architecture-level but also incorporates the power delivery model at the circuit-level into such system-level prediction. In order to enable the capability of on-the-fly noise prediction, we first bridge the gap between system-level workload and micro-architectural-level power by employing an OLS-based power estimation model and an adaptive ARIMA-based power prediction model. Then a layout-level supply noise model is developed to explore the correlations between micro-architectural-level power and layout-level supply noise. Compared with existing methods, the proposed ARIMA-based power model improves the prediction performance by up to 37.5%/63.0% in X86/ARM. Moreover, compared with SPICE simulation, our framework is able to estimate present supply noise with an average error of 0.005% and predict future supply noise with an average error of 1.58%/1.17% for X86/ARM architecture.

关键词Predictive models Estimation Integrated circuit modeling Adaptation models Sensors Correlation Time-varying systems
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收录类别SCI ; SCIE ; EI
语种英语
资助项目National Science Foundation of China[61401276]
WOS研究方向Computer Science ; Engineering
WOS类目Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic
WOS记录号WOS:000487193400011
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS关键词REGRESSION ; PERFORMANCE ; CIRCUITS
原始文献类型Early Access Articles
来源库IEEE
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/29574
专题信息科学与技术学院
信息科学与技术学院_PI研究组_周平强组
信息科学与技术学院_硕士生
作者单位
1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China
2.College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China
第一作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
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GB/T 7714
Yaguang Li,Cheng Zhuo,Pingqiang Zhou. A Cross-Layer Framework for Temporal Power and Supply Noise Prediction[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2018,38(99):1.
APA Yaguang Li,Cheng Zhuo,&Pingqiang Zhou.(2018).A Cross-Layer Framework for Temporal Power and Supply Noise Prediction.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,38(99),1.
MLA Yaguang Li,et al."A Cross-Layer Framework for Temporal Power and Supply Noise Prediction".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 38.99(2018):1.
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