ShanghaiTech University Knowledge Management System
A Cross-Layer Framework for Temporal Power and Supply Noise Prediction | |
2018 | |
发表期刊 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (IF:2.7[JCR-2023],2.9[5-Year]) |
ISSN | 0278-0070 |
卷号 | 38期号:99页码:1 |
发表状态 | 已发表 |
DOI | 10.1109/TCAD.2018.2871820 |
摘要 | In modern microprocessor and SoC designs, supply noise margin has been significantly reduced due to the continuously decreasing supply voltage level. On the other hand, with increasing current density, chips may see larger supply noise variations on various spots and from time to time. As a result, chip robustness and reliability are inevitably deteriorated with more frequent supply noise emergencies. It is therefore crucial to have an efficient supply noise prediction method to enhance design robustness. The state-of-art solutions either try to build a spatial noise estimation framework at the layout-level using the limited distributed physical noise sensors or attempt to develop emergency predictors at the architecture-level thus ignore back-end power delivery details In this paper, we propose a cross-layer framework for temporal supply noise prediction. Our method not only accounts for the temporal characteristics of workload execution at micro-architecture-level but also incorporates the power delivery model at the circuit-level into such system-level prediction. In order to enable the capability of on-the-fly noise prediction, we first bridge the gap between system-level workload and micro-architectural-level power by employing an OLS-based power estimation model and an adaptive ARIMA-based power prediction model. Then a layout-level supply noise model is developed to explore the correlations between micro-architectural-level power and layout-level supply noise. Compared with existing methods, the proposed ARIMA-based power model improves the prediction performance by up to 37.5%/63.0% in X86/ARM. Moreover, compared with SPICE simulation, our framework is able to estimate present supply noise with an average error of 0.005% and predict future supply noise with an average error of 1.58%/1.17% for X86/ARM architecture. |
关键词 | Predictive models Estimation Integrated circuit modeling Adaptation models Sensors Correlation Time-varying systems |
URL | 查看原文 |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
资助项目 | National Science Foundation of China[61401276] |
WOS研究方向 | Computer Science ; Engineering |
WOS类目 | Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic |
WOS记录号 | WOS:000487193400011 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
WOS关键词 | REGRESSION ; PERFORMANCE ; CIRCUITS |
原始文献类型 | Early Access Articles |
来源库 | IEEE |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/29574 |
专题 | 信息科学与技术学院 信息科学与技术学院_PI研究组_周平强组 信息科学与技术学院_硕士生 |
作者单位 | 1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China 2.College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China |
第一作者单位 | 信息科学与技术学院 |
第一作者的第一单位 | 信息科学与技术学院 |
推荐引用方式 GB/T 7714 | Yaguang Li,Cheng Zhuo,Pingqiang Zhou. A Cross-Layer Framework for Temporal Power and Supply Noise Prediction[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2018,38(99):1. |
APA | Yaguang Li,Cheng Zhuo,&Pingqiang Zhou.(2018).A Cross-Layer Framework for Temporal Power and Supply Noise Prediction.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,38(99),1. |
MLA | Yaguang Li,et al."A Cross-Layer Framework for Temporal Power and Supply Noise Prediction".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 38.99(2018):1. |
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