IN-SITU TEMPERATURE CONTROLLING SAMPLE STAGE CUSTOMIZED FOR COUPLED INTERCONNECTION BETWEEN IN-SITU HIGH-PRESSURE REACTION CELL AND ULTRAHIGH VACUUM CHARACTERIZATION
翻译题名为原位高压反应池与超高真空表征耦合互联定制的原位控温样品台
申请号US17367526
2023-01-05
公开(公告)号US20230005769A1
公开日期2023-01-05
摘要

The present disclosure relates to an in-situ temperature control platform, including an independent sample holder, a sample holder fixing cartridge, a customized sample stage and an anode contact pin. The independent sample holder includes a sample loading spot and a sample holder grip. The sample holder fixing cartridge includes a fixing cartridge body, the fixing cartridge body is provided with a sample holder slot, the bottom surface of the sample holder slot is provided with a heating element slot, and the sample holder slot is aligned with the sample loading spot. The bottom surface of the heating element slot is provided with a heating element fixing pinhole. The customized sample stage includes a sample stage body, the sample stage body is provided with a heating element support, and the heating element support is provided with a heating element.

翻译摘要

本公开涉及一种原位控温平台,包括独立样品架、样品架固定筒、定制样品台和阳极接触针。 独立的样品架包括样品加载点和样品架夹持器。 所述样品架固定筒包括固定筒本体,所述固定筒本体上设有样品架卡槽,所述样品架卡槽的底面设有加热元件卡槽,所述样品架卡槽对准所述上样点。 所述发热体卡槽的底面设有发热体固定针孔。 所述定制样品台包括样品台本体,所述样品台本体上设有加热元件支架,所述加热元件支架上设有加热元件。

当前权利人Shanghaitech University
专利申请人Shanghaitech University
公开国别US
公开国别简称US
IPC 分类号H01L21//67 ; H01L21//673
CPC分类号H01L21//67248 ; H01L21//67103 ; H01L21//67379
专利有效性有效
专利类型发明申请
专利类型字典1
当前法律状态授权
授权公告日2024-04-09
授权公开(公告)号US11955357B2
简单同族US20230005769A1
扩展同族US20230005769A1
INPADOC 同族US20230005769A1
文献类型专利
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/263293
专题物质科学与技术学院_PI研究组_杨永组
物质科学与技术学院_博士生
作者单位
Shanghaitech University
推荐引用方式
GB/T 7714
Yong Yang,Xiaohong Zhou,Evgeny Vovk,et al. IN-SITU TEMPERATURE CONTROLLING SAMPLE STAGE CUSTOMIZED FOR COUPLED INTERCONNECTION BETWEEN IN-SITU HIGH-PRESSURE REACTION CELL AND ULTRAHIGH VACUUM CHARACTERIZATION. US17367526[P]. 2023-01-05.
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