Erratum: Film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions (IEEE Trans. Appl. Supercond. (2019) 29:5 (1102105) DOI: 10.1109/tasc.2019.2904589)

doi:10.1109/TASC.2020.3048886

	Erratum: Film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions (IEEE Trans. Appl. Supercond. (2019) 29:5 (1102105) DOI: 10.1109/tasc.2019.2904589)
	2021-03-01
	Wu, Yu1,2,3
出处	IEEE Transactions on Applied Superconductivity
摘要	This addresses errors in the above paper [1]. The affiliation of author Yu Wu is corrected as follows. Y. Wu is with the Shanghai Institute of Microsystem and Information Technology and the Center for Excellence in Superconducting Electronics, Chinese Academy of Science, Shanghai 200050, China, and with the University of Chinese Academy of Science, Beijing 100049, China, and also with the School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China (e-mail: wuyu@shanghaitech.edu.cn). © 2021 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.
ISSN	1051-8223
出版者	Institute of Electrical and Electronics Engineers Inc.
DOI	10.1109/TASC.2020.3048886
语种	英语
卷号	31
期号	2
收录类别	EI
EI入藏号	20210809952475
原始文献类型	Erratum (ER)
文献类型	其他
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/251944
专题	物质科学与技术学院_博士生
作者单位	1.Shanghai Institute of Microsystem and Information Technology, The Center for Excellence in Superconducting Electronics, Chinese Academy of Science, Shanghai; 200050, China; 2.The University of Chinese Academy of Science, Beijing; 100049, China; 3.The School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China; 4.The University of Chinese Academy of Science, Beijing; 100049, China
第一作者单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Wu, Yu. Erratum: Film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions (IEEE Trans. Appl. Supercond. (2019) 29:5 (1102105) DOI: 10.1109/tasc.2019.2904589). 2021-03-01.