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Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes
2022-10
发表期刊MICROMACHINES (IF:3.0[JCR-2023],3.0[5-Year])
ISSN2072-666X
EISSN2072-666X
卷号13期号:10
发表状态已发表
DOI10.3390/mi13101629
摘要

In the past decade, aluminum scandium nitride (AlScN) with a high Sc content has shown ferroelectric properties, which provides a new option for CMOS-process-compatible ferroelectric memory, sensors and actuators, as well as tunable devices. In this paper, the ferroelectric properties of Al0.7Sc0.3N grown on different metals were studied. The effect of metal and abnormal orientation grains (AOGs) on ferroelectric properties was observed. A coercive field of approximately 3 MV/cm and a large remanent polarization of more than 100 mu C/cm(2) were exhibited on the Pt surface. The Al0.7Sc0.3N thin film grown on the Mo metal surface exhibited a large leakage current. We analyzed the leakage current of Al0.7Sc0.3N during polarization with the polarization frequency, and found that the Al0.7Sc0.3N films grown on either Pt or Mo surfaces have large leakage currents at frequencies below 5 kHz. The leakage current decreases significantly as the frequency approaches 10 kHz. The positive up negative down (PUND) measurement was used to obtain the remanent polarization of the films, and it was found that the remanent polarization values were not the same in the positive and negative directions, indicating that the electrode material has an effect on the ferroelectric properties.

关键词AlScN ferroelectric thin film leakage current PUND test
收录类别SCIE ; EI
语种英语
WOS研究方向Chemistry ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS类目Chemistry, Analytical ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied
WOS记录号WOS:000873139200001
出版者MDPI
原始文献类型Article
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/243224
专题信息科学与技术学院_博士生
信息科学与技术学院_PI研究组_吴涛组
信息科学与技术学院_硕士生
通讯作者Wu, Tao
作者单位
1.ShanghaiTech Univ, Shanghai Engn Res Ctr Energy Efficient & Custom A, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China;
2.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China;
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China;
4.Shanghai IC R&D Ctr, Proc Technol Dept, Shanghai 201203, Peoples R China
第一作者单位上海科技大学
通讯作者单位上海科技大学
第一作者的第一单位上海科技大学
推荐引用方式
GB/T 7714
Nie, Ran,Shao, Shuai,Luo, Zhifang,et al. Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes[J]. MICROMACHINES,2022,13(10).
APA Nie, Ran,Shao, Shuai,Luo, Zhifang,Kang, Xiaoxu,&Wu, Tao.(2022).Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes.MICROMACHINES,13(10).
MLA Nie, Ran,et al."Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes".MICROMACHINES 13.10(2022).
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