| |||||||
ShanghaiTech University Knowledge Management System
Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes | |
2022-10 | |
发表期刊 | MICROMACHINES (IF:3.0[JCR-2023],3.0[5-Year]) |
ISSN | 2072-666X |
EISSN | 2072-666X |
卷号 | 13期号:10 |
发表状态 | 已发表 |
DOI | 10.3390/mi13101629 |
摘要 | In the past decade, aluminum scandium nitride (AlScN) with a high Sc content has shown ferroelectric properties, which provides a new option for CMOS-process-compatible ferroelectric memory, sensors and actuators, as well as tunable devices. In this paper, the ferroelectric properties of Al0.7Sc0.3N grown on different metals were studied. The effect of metal and abnormal orientation grains (AOGs) on ferroelectric properties was observed. A coercive field of approximately 3 MV/cm and a large remanent polarization of more than 100 mu C/cm(2) were exhibited on the Pt surface. The Al0.7Sc0.3N thin film grown on the Mo metal surface exhibited a large leakage current. We analyzed the leakage current of Al0.7Sc0.3N during polarization with the polarization frequency, and found that the Al0.7Sc0.3N films grown on either Pt or Mo surfaces have large leakage currents at frequencies below 5 kHz. The leakage current decreases significantly as the frequency approaches 10 kHz. The positive up negative down (PUND) measurement was used to obtain the remanent polarization of the films, and it was found that the remanent polarization values were not the same in the positive and negative directions, indicating that the electrode material has an effect on the ferroelectric properties. |
关键词 | AlScN ferroelectric thin film leakage current PUND test |
收录类别 | SCIE ; EI |
语种 | 英语 |
WOS研究方向 | Chemistry ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics |
WOS类目 | Chemistry, Analytical ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied |
WOS记录号 | WOS:000873139200001 |
出版者 | MDPI |
原始文献类型 | Article |
引用统计 | 正在获取...
|
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/243224 |
专题 | 信息科学与技术学院_博士生 信息科学与技术学院_PI研究组_吴涛组 信息科学与技术学院_硕士生 |
通讯作者 | Wu, Tao |
作者单位 | 1.ShanghaiTech Univ, Shanghai Engn Res Ctr Energy Efficient & Custom A, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China; 2.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China; 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China; 4.Shanghai IC R&D Ctr, Proc Technol Dept, Shanghai 201203, Peoples R China |
第一作者单位 | 上海科技大学 |
通讯作者单位 | 上海科技大学 |
第一作者的第一单位 | 上海科技大学 |
推荐引用方式 GB/T 7714 | Nie, Ran,Shao, Shuai,Luo, Zhifang,et al. Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes[J]. MICROMACHINES,2022,13(10). |
APA | Nie, Ran,Shao, Shuai,Luo, Zhifang,Kang, Xiaoxu,&Wu, Tao.(2022).Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes.MICROMACHINES,13(10). |
MLA | Nie, Ran,et al."Characterization of Ferroelectric Al0.7Sc0.3N Thin Film on Pt and Mo Electrodes".MICROMACHINES 13.10(2022). |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 |
修改评论
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。