ShanghaiTech University Knowledge Management System
Improve the On-Resistance for 80V NLDMOS with STI Technology in 0.18 UM BCD Process | |
2022 | |
会议录名称 | 2022 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE, CSTIC 2022 |
发表状态 | 已发表 |
DOI | 10.1109/CSTIC55103.2022.9856810 |
摘要 | In recent years, devices used in power application are required to operate at high voltage, high frequency conditions and at low current to save energy. As a result, it is important to improve the specific on-resistance (RON) for switch LDMOS. In this paper, we will aim at 80VnLDMOS in 0.18um BCD process to discuss the composition of on-resistance and analysis the dominated part of RON. This paper also proposes a simple method to improve the RON. Based on no additional masks and complex process flows, the combination of adjusting ratio of field plate and multiple ion implantation in drift region can improve BV and reduce Ron. The method can improve the on-resistance, which are proved by TCAD simulation results. © 2022 IEEE. |
关键词 | BCD process Condition High frequency HF High-voltages Low currents On-resistance Power applications Save energy SIMPLE method Specific-on-resistance |
会议名称 | 2022 China Semiconductor Technology International Conference, CSTIC 2022 |
会议地点 | Shanghai, China |
会议日期 | June 20, 2022 - June 21, 2022 |
URL | 查看原文 |
收录类别 | EI |
语种 | 英语 |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
EI入藏号 | 20223712740123 |
原始文献类型 | Conference article (CA) |
来源库 | IEEE |
文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/232003 |
专题 | 信息科学与技术学院 信息科学与技术学院_硕士生 |
作者单位 | 1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China 2.HuaHong Grace Semiconductor Manufacturing Corporation, Shanghai, China |
第一作者单位 | 信息科学与技术学院 |
第一作者的第一单位 | 信息科学与技术学院 |
推荐引用方式 GB/T 7714 | Xiaoming Zhang,Donghua Liu,Haiyang Ling,et al. Improve the On-Resistance for 80V NLDMOS with STI Technology in 0.18 UM BCD Process[C]:Institute of Electrical and Electronics Engineers Inc.,2022. |
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