Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses

doi:10.1103/PhysRevLett.120.223201

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	Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses
	Kumagai, Yoshiaki 1; Jurek, Zoltan 2,3; Xu, Weiqing1,4 ; Fukuzawa, Hironobu 1,5; Motomura, Koji 1; Iablonskyi, Denys 1; Nagaya, Kiyonobu 5,6; Wada, Shin-ichi 5,7; Mondal, Subhendu 1; Tachibana, Tetsuya 1; Ito, Yuta 1; Sakai, Tsukasa 6; Matsunami, Kenji 6; Nishiyama, Toshiyuki 6; Umemoto, Takayuki 7; Nicolas, Christophe 8; Miron, Catalin 8,9,10; Togashi, Tadashi 11; Ogawa, Kanade 5; Owada, Shigeki 5; Tono, Kensuke 11; Yabashi, Makina 5; Son, Sang-Kil 2,3; Ziaja, Beata 2,3,12; Santra, Robin 2,3,13; Ueda, Kiyoshi 1,5
	2018-05-31
发表期刊	PHYSICAL REVIEW LETTERS
ISSN	0031-9007
卷号	120 期号:22
发表状态	已发表
DOI	10.1103/PhysRevLett.120.223201
摘要	We show that electron and ion spectroscopy reveals the details of the oligomer formation in Ar clusters exposed to an x-ray free electron laser (XFEL) pulse, i.e., chemical dynamics triggered by x rays. With guidance from a dedicated molecular dynamics simulation tool, we find that van der Waals bonding, the oligomer formation mechanism, and charge transfer among the cluster constituents significantly affect ionization dynamics induced by an XFEL pulse of moderate fluence. Our results clearly demonstrate that XFEL pulses can be used not only to "damage and destroy" molecular assemblies but also to modify and transform their molecular structure. The accuracy of the predictions obtained makes it possible to apply the cluster spectroscopy, in connection with the respective simulations, for estimation of the XFEL pulse fluence in the fluence regime below single-atom multiple-photon absorption, which is hardly accessible with other diagnostic tools.
收录类别	SCI ; SCIE ; EI
语种	英语
资助项目	[2014A8040]
WOS研究方向	Physics
WOS类目	Physics, Multidisciplinary
WOS记录号	WOS:000433915100008
出版者	AMER PHYSICAL SOC
EI入藏号	20182405311039
EI主题词	Argon lasers ; Charge transfer ; Chemical bonds ; Electrons ; Free electron lasers ; Molecular dynamics ; Oligomers ; Van der Waals forces
EI分类号	Lasers, General:744.1 ; Free Electron Lasers:744.5 ; Physical Chemistry:801.4 ; Chemical Reactions:802.2 ; Organic Polymers:815.1.1 ; High Energy Physics:932.1
WOS关键词	FREE-ELECTRON LASER ; RARE-GAS CLUSTERS ; COULOMB EXPLOSION ; SCATTERING ; AR-2(+) ; TRANSITIONS ; IONIZATION ; MOLECULES ; CURVES ; STATES
原始文献类型	Article
引用统计
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/23087
专题	物质科学与技术学院_科学装置(X)_活细胞结构与功能成像等线站工程项目
通讯作者	Kumagai, Yoshiaki
作者单位	1.Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan 2.DESY, Ctr Free Electron Laser Sci, Notkestrasse 85, D-22607 Hamburg, Germany 3.Hamburg Ctr Ultrafast Imaging, Luruper Chaussee 149, D-22671 Hamburg, Germany 4.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China 5.RIKEN SPring 8 Ctr, Sayo, Hyogo 6795148, Japan 6.Kyoto Univ, Dept Phys, Kyoto 6068502, Japan 7.Hiroshima Univ, Dept Phys Sci, Higashihiroshima 7398526, Japan 8.Synchrotron SOLEIL, BP 48, F-91192 Gif Sur Yvette, France 9.Horia Hulubei Natl Inst Phys & Nucl Engn, ELI NP, 30 Reactorului St, RO-077125 Magurele, Jud Ilfov, Romania 10.Univ Paris Saclay, CEA Saclay, CNRS, LIDYL,CEA, F-91191 Gif Sur Yvette, France 11.Japan Synchrotron Radiat Res Inst JASRI, Sayo, Hyogo 6795198, Japan 12.PAS, Inst Nucl Phys, Radzikowskiego 152, PL-31342 Krakow, Poland 13.Univ Hamburg, Dept Phys, Jungiusstr 9, D-20355 Hamburg, Germany
推荐引用方式 GB/T 7714	Kumagai, Yoshiaki,Jurek, Zoltan,Xu, Weiqing,et al. Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses[J]. PHYSICAL REVIEW LETTERS,2018,120(22).
APA	Kumagai, Yoshiaki.,Jurek, Zoltan.,Xu, Weiqing.,Fukuzawa, Hironobu.,Motomura, Koji.,...&Ueda, Kiyoshi.(2018).Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses.PHYSICAL REVIEW LETTERS,120(22).
MLA	Kumagai, Yoshiaki,et al."Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses".PHYSICAL REVIEW LETTERS 120.22(2018).