Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface

doi:10.1038/srep09788

	Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface
	Axnanda, Stephanus 1; Crumlin, Ethan J.1; Mao, Baohua 1,2; Rani, Sana 1; Chang, Rui 1,2; Karlsson, Patrik G.3; Edwards, Marten O. M.3; Lundqvist, Mans 3; Moberg, Robert 3; Ross, Phil 4; Hussain, Zahid 1; Liu, Zhi1,2,5
	2015-05-07
发表期刊	SCIENTIFIC REPORTS (IF:3.8[JCR-2023],4.3[5-Year])
ISSN	2045-2322
卷号	5
发表状态	已发表
DOI	10.1038/srep09788
摘要	We report a new method to probe the solid-liquid interface through the use of a thin liquid layer on a solid surface. An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kinetic energy photoelectrons (7 keV) at a pressure up to 110 Torr has been constructed and commissioned. Additionally, we have deployed a "dip & pull" method to create a stable nanometers-thick aqueous electrolyte on platinum working electrode surface. Combining the newly constructed AP-XPS system, "dip & pull" approach, with a "tender" X-ray synchrotron source (2 keV-7 keV), we are able to access the interface between liquid and solid dense phases with photoelectrons and directly probe important phenomena occurring at the narrow solid-liquid interface region in an electrochemical system. Using this approach, we have performed electrochemical oxidation of the Pt electrode at an oxygen evolution reaction (OER) potential. Under this potential, we observe the formation of both Pt2+ and Pt4+ interfacial species on the Pt working electrode in situ. We believe this thin-film approach and the use of "tender" AP-XPS highlighted in this study is an innovative new approach to probe this key solid-liquid interface region of electrochemistry.
收录类别	SCI
语种	英语
资助项目	Natural Science Foundation of China[11227902]
WOS研究方向	Science & Technology - Other Topics
WOS类目	Multidisciplinary Sciences
WOS记录号	WOS:000354108600001
出版者	NATURE PUBLISHING GROUP
WOS关键词	OXIDE ELECTROCHEMICAL-CELLS ; IN-SITU ; ELECTRON-SPECTROSCOPY ; CO OXIDATION ; SURFACE-ANALYSIS ; CROSS-SECTIONS ; DOUBLE-LAYER ; PLATINUM ; XPS ; OXYGEN
原始文献类型	Article
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2213
专题	大科学中心_PI研究组_刘志组物质科学与技术学院
通讯作者	Liu, Zhi
作者单位	1.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA 2.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 3.VG Scienta, SE-75228 Uppsala, Sweden 4.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA 5.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 200031, Peoples R China
通讯作者单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Axnanda, Stephanus,Crumlin, Ethan J.,Mao, Baohua,et al. Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface[J]. SCIENTIFIC REPORTS,2015,5.
APA	Axnanda, Stephanus.,Crumlin, Ethan J..,Mao, Baohua.,Rani, Sana.,Chang, Rui.,...&Liu, Zhi.(2015).Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface.SCIENTIFIC REPORTS,5.
MLA	Axnanda, Stephanus,et al."Using "Tender" X-ray Ambient Pressure X-Ray Photoelectron Spectroscopy as A Direct Probe of Solid-Liquid Interface".SCIENTIFIC REPORTS 5(2015).