An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces
Lichterman, Michael F.1,2; Richter, Matthias H.1,2; Hu, Shu1,2; Crumlin, Ethan J.3; Axnanda, Stephanus3; Favaro, Marco3,4,5; Drisdell, Walter3,4; Hussain, Zahid3; Brunschwig, Bruce S.2,6; Lewis, Nathan S.1,2,6,7; Liu, Zhi3,8,9; Lewerenz, Hans-Joachim2
2016
Source PublicationJOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN0013-4651
Volume163Issue:2Pages:H139-H146
Status已发表
DOI10.1149/2.0861602jes
AbstractThe electrical and spectroscopic properties of the TiO2/Ni protection layer system, which enables stabilization of otherwise corroding photoanodes, have been investigated in contact with electrolyte solutions by scanning-probe microscopy, electrochemistry and in-situ ambient pressure X-ray photoelectron spectroscopy (AP-XPS). Specifically, the energy-band relations of the p(+)-Si/ALD-TiO2/Ni interface have been determined for a selected range of Ni thicknesses. AP-XPS measurements using tender X-rays were performed in a three-electrode electrochemical arrangement under potentiostatic control to obtain information from the semiconductor near-surface region, the electrochemical double layer (ECDL) and the electrolyte beyond the ECDL. The degree of conductivity depended on the chemical state of the Ni on the TiO2 surface. At low loadings of Ni, the Ni was present primarily as an oxide layer and the samples were not conductive, although the TiO2 XPS core levels nonetheless displayed behavior indicative of a metal-electrolyte junction. In contrast, as the Ni thickness increased, the Ni phase was primarily metallic and the electrochemical behavior became highly conductive, with the AP-XPS data indicative of a metal-electrolyte junction. Electrochemical and microtopographical methods have been employed to better define the nature of the TiO2/Ni electrodes and to contextualize the AP-XPS results. (C) The Author(s) 2015. Published by ECS.
Indexed BySCI ; EI
Language英语
Funding ProjectOffice of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy[DE AC02 05CH11231]
WOS Research AreaElectrochemistry ; Materials Science
WOS SubjectElectrochemistry ; Materials Science, Coatings & Films
WOS IDWOS:000367324400099
PublisherELECTROCHEMICAL SOC INC
EI Accession Number20155101679170
EI KeywordsElectrochemical electrodes ; Electrochemistry ; Electrodes ; Electrolytes ; Magnesium printing plates ; Nickel ; Photoelectrons ; Photons ; Scanning probe microscopy ; Semiconductor junctions ; Titanium dioxide
EI Classification NumberNickel:548.1 ; Electric Batteries and Fuel Cells:702 ; Semiconductor Devices and Integrated Circuits:714.2 ; Printing Equipment:745.1.1 ; Chemistry:801 ; Electrochemistry:801.4.1 ; Chemical Agents and Basic Industrial Chemicals:803 ; Chemical Products Generally:804 ; Inorganic Compounds:804.2 ; Atomic and Molecular Physics:931.3
WOS KeywordLAYER DEPOSITED TIO2 ; ELECTROLYTIC HYDROGENATION ; PHOTOANODES ; SILICON ; WATER ; SURFACES ; SI
Original Document TypeArticle
Citation statistics
Cited Times:16[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttps://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2058
Collection物质科学与技术学院
大科学中心_PI研究组_刘志组
Corresponding AuthorLichterman, Michael F.
Affiliation1.CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA
2.CALTECH, Joint Ctr Artificial Photosynth, Pasadena, CA 91125 USA
3.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA
4.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
5.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USA
6.CALTECH, Beckman Inst, Pasadena, CA 91125 USA
7.CALTECH, Kavli Nanosci Inst, Pasadena, CA 91125 USA
8.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
9.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 200031, Peoples R China
Recommended Citation
GB/T 7714
Lichterman, Michael F.,Richter, Matthias H.,Hu, Shu,et al. An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY,2016,163(2):H139-H146.
APA Lichterman, Michael F..,Richter, Matthias H..,Hu, Shu.,Crumlin, Ethan J..,Axnanda, Stephanus.,...&Lewerenz, Hans-Joachim.(2016).An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces.JOURNAL OF THE ELECTROCHEMICAL SOCIETY,163(2),H139-H146.
MLA Lichterman, Michael F.,et al."An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces".JOURNAL OF THE ELECTROCHEMICAL SOCIETY 163.2(2016):H139-H146.
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