An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces

doi:10.1149/2.0861602jes

	An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces
	Lichterman, Michael F.1,2; Richter, Matthias H.1,2; Hu, Shu 1,2; Crumlin, Ethan J.3; Axnanda, Stephanus 3; Favaro, Marco 3,4,5; Drisdell, Walter 3,4; Hussain, Zahid 3; Brunschwig, Bruce S.2,6; Lewis, Nathan S.1,2,6,7; Liu, Zhi3,8,9 ; Lewerenz, Hans-Joachim 2
	2016
发表期刊	JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN	0013-4651
卷号	163 期号:2 页码:H139-H146
发表状态	已发表
DOI	10.1149/2.0861602jes
摘要	The electrical and spectroscopic properties of the TiO2/Ni protection layer system, which enables stabilization of otherwise corroding photoanodes, have been investigated in contact with electrolyte solutions by scanning-probe microscopy, electrochemistry and in-situ ambient pressure X-ray photoelectron spectroscopy (AP-XPS). Specifically, the energy-band relations of the p(+)-Si/ALD-TiO2/Ni interface have been determined for a selected range of Ni thicknesses. AP-XPS measurements using tender X-rays were performed in a three-electrode electrochemical arrangement under potentiostatic control to obtain information from the semiconductor near-surface region, the electrochemical double layer (ECDL) and the electrolyte beyond the ECDL. The degree of conductivity depended on the chemical state of the Ni on the TiO2 surface. At low loadings of Ni, the Ni was present primarily as an oxide layer and the samples were not conductive, although the TiO2 XPS core levels nonetheless displayed behavior indicative of a metal-electrolyte junction. In contrast, as the Ni thickness increased, the Ni phase was primarily metallic and the electrochemical behavior became highly conductive, with the AP-XPS data indicative of a metal-electrolyte junction. Electrochemical and microtopographical methods have been employed to better define the nature of the TiO2/Ni electrodes and to contextualize the AP-XPS results. (C) The Author(s) 2015. Published by ECS.
收录类别	SCI ; EI
语种	英语
资助项目	Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy[DE AC02 05CH11231]
WOS研究方向	Electrochemistry ; Materials Science
WOS类目	Electrochemistry ; Materials Science, Coatings & Films
WOS记录号	WOS:000367324400099
出版者	ELECTROCHEMICAL SOC INC
EI入藏号	20155101679170
EI主题词	Electrochemical electrodes ; Electrochemistry ; Electrodes ; Electrolytes ; Magnesium printing plates ; Nickel ; Photoelectrons ; Photons ; Scanning probe microscopy ; Semiconductor junctions ; Titanium dioxide
EI分类号	Nickel:548.1 ; Electric Batteries and Fuel Cells:702 ; Semiconductor Devices and Integrated Circuits:714.2 ; Printing Equipment:745.1.1 ; Chemistry:801 ; Electrochemistry:801.4.1 ; Chemical Agents and Basic Industrial Chemicals:803 ; Chemical Products Generally:804 ; Inorganic Compounds:804.2 ; Atomic and Molecular Physics:931.3
WOS关键词	LAYER DEPOSITED TIO2 ; ELECTROLYTIC HYDROGENATION ; PHOTOANODES ; SILICON ; WATER ; SURFACES ; SI
原始文献类型	Article
引用统计
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2058
专题	物质科学与技术学院大科学中心_PI研究组_刘志组
通讯作者	Lichterman, Michael F.
作者单位	1.CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA 2.CALTECH, Joint Ctr Artificial Photosynth, Pasadena, CA 91125 USA 3.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA 4.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA 5.Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USA 6.CALTECH, Beckman Inst, Pasadena, CA 91125 USA 7.CALTECH, Kavli Nanosci Inst, Pasadena, CA 91125 USA 8.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 9.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 200031, Peoples R China
推荐引用方式 GB/T 7714	Lichterman, Michael F.,Richter, Matthias H.,Hu, Shu,et al. An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY,2016,163(2):H139-H146.
APA	Lichterman, Michael F..,Richter, Matthias H..,Hu, Shu.,Crumlin, Ethan J..,Axnanda, Stephanus.,...&Lewerenz, Hans-Joachim.(2016).An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces.JOURNAL OF THE ELECTROCHEMICAL SOCIETY,163(2),H139-H146.
MLA	Lichterman, Michael F.,et al."An Electrochemical, Microtopographical and Ambient Pressure X-Ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces".JOURNAL OF THE ELECTROCHEMICAL SOCIETY 163.2(2016):H139-H146.