| LEAKAGE POWER REDUCTION IN MULTICORE CHIPS VIA ONLINE DECAP MODULATION |
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| 2016
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会议录名称 | 2016 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE (CSTIC)
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发表状态 | 已发表
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DOI | 10.1109/CSTIC.2016.7463916
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摘要 | The decap leakage constitutes a significant part of total leakage in multicore processors. Leaking decap is widely used in chips to provide transient power to function blocks, and the amount of decap placed over multicore chip is determined by the worst case at design time. Considering that the decaps do not have to be kept 100% "on" when the chip is running workloads, in this paper we propose an ideal online approach to adapt the percentage of "on" capacitance in the decaps to the dynamic need of the core loads, and therefore to reduce the leakage power consumption in the chip. Our approach is based on the equivalent resistance model of the power sources (power supply pins and local decaps) and the core loads, and a novel fast algorithm is developed to determine the required amount of decap at runtime Results on a set of multicore test cases show that our approach can achieve up to 48% saving in decap leakage. |
关键词 | Multicore processing
Benchmark testing
Capacitance
Load modeling
Runtime
Pins
Power demand
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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会议地点 | Shanghai
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会议日期 | 13-14 March 2016
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URL | 查看原文
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收录类别 | CPCI
; EI
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语种 | 英语
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资助项目 | National Natural Science Foundation of China[61401276]
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WOS研究方向 | Engineering
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WOS类目 | Engineering, Electrical & Electronic
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WOS记录号 | WOS:000381743000021
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出版者 | IEEE
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EI入藏号 | 20162502509304
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EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
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WOS关键词 | CIRCUITS
; DESIGN
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原始文献类型 | Proceedings Paper
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来源库 | IEEE
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引用统计 | 正在获取...
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文献类型 | 会议论文
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条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2007
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专题 | 信息科学与技术学院_PI研究组_周平强组
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通讯作者 | Wang, Leilei |
作者单位 | ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai, Peoples R China
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第一作者单位 | 信息科学与技术学院
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通讯作者单位 | 信息科学与技术学院
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第一作者的第一单位 | 信息科学与技术学院
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推荐引用方式 GB/T 7714 |
Wang, Leilei,Zhou, Pingqiang. LEAKAGE POWER REDUCTION IN MULTICORE CHIPS VIA ONLINE DECAP MODULATION[C].
345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2016.
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