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Large Photomultiplication by Charge-Self-Trapping for High-Response Quantum Dot Infrared Photodetectors
2022-03-30
发表期刊ACS APPLIED MATERIALS AND INTERFACES (IF:8.3[JCR-2023],8.7[5-Year])
ISSN1944-8244
EISSN1944-8252
卷号14期号:12
发表状态已发表
DOI10.1021/acsami.2c01046
摘要

PbS colloidal quantum dots (CQDs) are emerging as promising candidates for next-generation, low-cost, and high-performance infrared photodetectors. Recently, photomultiplication has been explored to improve the detectivity of CQD infrared photodetectors by doping charge-trapping material into a matrix. However, this relies on remote doping that could influence carrier transfer giving rise to limited photomultiplication. Herein, a charge-self-trapped ZnO layer is prepared by a surface reaction between acid and ZnO. Photogenerated electrons trapped by oxygen vacancy defects at the ZnO surface generate a strong interfacial electrical field and induce large photomultiplication at extremely low bias. A PbS CQD infrared photodiode based on this structure shows a response (R) of 77.0 A·W-1 and specific detectivity of 1.5 × 1011 Jones at 1550 nm under a -0.3 V bias. This self-trapped ZnO layer can be applied to other photodetectors such as perovskite-based devices. © 2022 American Chemical Society. All rights reserved.

关键词II-VI semiconductors Infrared detectors IV-VI semiconductors Lead compounds Nanocrystals Oxygen Perovskite Photons Semiconductor quantum dots Surface reactions Zinc oxide Colloidal quantum dots High response Infrared photodetector Low-high PbS quantum dots Photomultiplication Quantum dots infrared photodetectors Self-trapping ZnO layers ZnO nanocrystal
学科领域材料科学
收录类别SCI ; EI ; SCIE
语种英语
资助项目National Key Research and Development Program of China[2021YFA0715502] ; National Natural Science Foundation of China[92056119,61935016,62004125,
WOS研究方向Science & Technology - Other Topics ; Materials Science
WOS类目Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号WOS:000787374700078
出版者American Chemical Society
EI入藏号20221411906529
EI主题词Oxygen vacancies
EI分类号482.2 Minerals ; 712.1 Semiconducting Materials ; 714.2 Semiconductor Devices and Integrated Circuits ; 761 Nanotechnology ; 802.2 Chemical Reactions ; 804 Chemical Products Generally ; 804.2 Inorganic Compounds ; 931.3 Atomic and Molecular Physics ; 933.1 Crystalline Solids ; 944.7 Radiation Measuring Instruments
原始文献类型Article in Press
引用统计
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/169314
专题物质科学与技术学院
物质科学与技术学院_PI研究组_宁志军组
物质科学与技术学院_PI研究组_薛加民组
信息科学与技术学院_PI研究组_陈佰乐组
物质科学与技术学院_硕士生
物质科学与技术学院_博士生
大科学中心_PI研究组_翁祖谦组
共同第一作者Ke, Liang; Dou, Hongbin; Xu, Rui
通讯作者Li, Lin; Ning, Zhijun
作者单位
1.School of Physical Science and Technology, ShanghaiTech University, 393 Middle Huaxia Road, Pudong, Shanghai; 201210, China;
2.Center for Transformative Science, ShanghaiTech University, 393 Middle Huaxia, Pudong, Shanghai; 201210, China;
3.School of Information Science and Technology, ShanghaiTech University, 393 Middle Huaxia Road, Pudong, Shanghai; 201210, China;
4.State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai; 200050, China
第一作者单位物质科学与技术学院
通讯作者单位物质科学与技术学院;  上海科技大学
第一作者的第一单位物质科学与技术学院
推荐引用方式
GB/T 7714
Xu, Kaimin,Ke, Liang,Dou, Hongbin,et al. Large Photomultiplication by Charge-Self-Trapping for High-Response Quantum Dot Infrared Photodetectors[J]. ACS APPLIED MATERIALS AND INTERFACES,2022,14(12).
APA Xu, Kaimin.,Ke, Liang.,Dou, Hongbin.,Xu, Rui.,Zhou, Wenjia.,...&Ning, Zhijun.(2022).Large Photomultiplication by Charge-Self-Trapping for High-Response Quantum Dot Infrared Photodetectors.ACS APPLIED MATERIALS AND INTERFACES,14(12).
MLA Xu, Kaimin,et al."Large Photomultiplication by Charge-Self-Trapping for High-Response Quantum Dot Infrared Photodetectors".ACS APPLIED MATERIALS AND INTERFACES 14.12(2022).
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