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Low voltage field emission of single Cu nanowire in air with nanoscale gaps for vacuum electronics | |
2017-11 | |
发表期刊 | MICRO & NANO LETTERS (IF:1.5[JCR-2023],1.1[5-Year]) |
ISSN | 1750-0443 |
卷号 | 12期号:11页码:897-900 |
发表状态 | 已发表 |
DOI | 10.1049/mnl.2017.0411 |
摘要 | Field emission applications to date including displays have featured electrode gaps in the micron scale or even larger. Devices such as vacuum field effect transistors demand smaller gaps for improved performance and continued scaling. The present work investigates nanoscale cathode-anode distances and evaluated field emission characteristics using a single Cu emitter. The gap was systematically varied between 20 and 80 nm with the aid of focused ion beam etching. Field emission was achieved at bias voltages below 5 V under atmospheric conditions with a 20 nm gap between the cathode and anode. The turn-on voltage was 1.75 V and the maximum current reached 32.5 nA at 5 V. The emission current is dependent on the cathode-anode distance and decreases exponentially with increasing distance. The nanoscale gap allows lower drive voltages than in previous studies while providing large emission currents for a single emitter. |
关键词 | field emission cathodes nanowires copper focused ion beam technology sputter etching low voltage field emission single Cu nanowire nanoscale gaps vacuum electronics nanoscale cathode-anode distances single Cu emitter focused ion beam etching bias voltages turn-on voltage emission current Cu |
收录类别 | SCI ; CPCI ; EI |
语种 | 英语 |
资助项目 | National Natural Science Foundation of China[61327811] |
WOS研究方向 | Science & Technology - Other Topics ; Materials Science |
WOS类目 | Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary |
WOS记录号 | WOS:000414615000015 |
出版者 | INST ENGINEERING TECHNOLOGY-IET |
EI入藏号 | 20174604395048 |
EI主题词 | Anodes ; Cathodes ; Electrodes ; Field effect transistors ; Field emission ; Field emission cathodes ; Ion beams ; Nanotechnology ; Vacuum technology |
EI分类号 | Vacuum Technology:633 ; Electron Tubes:714.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Nanotechnology:761 ; High Energy Physics:932.1 |
WOS关键词 | INDIVIDUAL CARBON NANOTUBES ; FABRICATION |
原始文献类型 | Article ; Proceedings Paper |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/14256 |
专题 | 信息科学与技术学院_特聘教授组_王跃林组 信息科学与技术学院_博士生 |
通讯作者 | Wang, Yuelin |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Sci & Technol Lab Microsyst, Shanghai 200050, Peoples R China 2.Univ Chinese Acad Sci, Sch Elect Elect & Commun Engn, Beijing 100049, Peoples R China 3.Univ ShanghaiTech, Sch Informat Sci & Technol, Shanghai 200120, Peoples R China |
第一作者单位 | 上海科技大学 |
通讯作者单位 | 上海科技大学 |
推荐引用方式 GB/T 7714 | Liu, Meng,Yang, Yang,Li, Tie,et al. Low voltage field emission of single Cu nanowire in air with nanoscale gaps for vacuum electronics[J]. MICRO & NANO LETTERS,2017,12(11):897-900. |
APA | Liu, Meng,Yang, Yang,Li, Tie,&Wang, Yuelin.(2017).Low voltage field emission of single Cu nanowire in air with nanoscale gaps for vacuum electronics.MICRO & NANO LETTERS,12(11),897-900. |
MLA | Liu, Meng,et al."Low voltage field emission of single Cu nanowire in air with nanoscale gaps for vacuum electronics".MICRO & NANO LETTERS 12.11(2017):897-900. |
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