Flexible Array Probe With In-Plane Differential Multichannels for Inspection of Microdefects on Curved Surface
2022-01
发表期刊IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (IF:7.5[JCR-2023],8.0[5-Year])
ISSN0278-0046
EISSN1557-9948
卷号69期号:1页码:900-910
发表状态已发表
DOI10.1109/TIE.2021.3050376
摘要

It is critical for maintaining the safe operation of turbine blades to inspect the potential structural damages promptly. However, the industry still lacks efficient tools for inspection of the curved surface. In this respect, in this article, a new flexible probe with in-plane differential coils is proposed. With the sophisticated configuration, the probe has four channels, which complement each other in terms of sensitivity to defects of different orientations. The in-plane differential scheme nulls the background signal and reduces the noise resulting in high sensitivity to microdefects. The probe can be bent according to the curved surface due to its flexible configuration. A three-dimensional finite-element method model based on the cluster parallel computation is utilized to study the feasibility and performance of the probe, and a prototype probe is developed and tested by scanning defects on the curved surface of a turbine blade sample. Furthermore, a data fusion method is proposed to obtain a better signal-to-noise ratio so that defects with length*width*depth = 2.5 mm*0.1 mm*0.1 mm can be identified. Based on repeated experiments, it is observed that the probability of detection with the fusion of the multichannels is higher than that of every single channel demonstrating that the data fusion increases the reliability of the inspection.

关键词Probes Coils Blades Turbines Inspection Sensitivity Sensors Differential measurement eddy current testing (ECT) flexible array probe multichannels probability of detection (POD) Data fusion Turbine components Turbomachine blades 3 D finite element method Background signals Data fusion methods Differential scheme High sensitivity Parallel Computation Probability of detection Structural damages
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收录类别EI ; SCIE
语种英语
WOS研究方向Automation & Control Systems ; Engineering ; Instruments & Instrumentation
WOS类目Automation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号WOS:000704120200088
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
EI入藏号20210409829959
EI主题词Signal to noise ratio
EI分类号617 Turbines and Steam Turbines ; 716.1 Information Theory and Signal Processing ; 723.2 Data Processing and Image Processing
原始文献类型Article
来源库IEEE
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/128411
专题信息科学与技术学院
信息科学与技术学院_PI研究组_叶朝锋组
信息科学与技术学院_硕士生
信息科学与技术学院_博士生
作者单位
1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China
2.School of Information Science and Technology, ShanghaiTech University, Shanghai, China,
第一作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
推荐引用方式
GB/T 7714
Chaofeng Ye,Na Zhang,Lei Peng,et al. Flexible Array Probe With In-Plane Differential Multichannels for Inspection of Microdefects on Curved Surface[J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,2022,69(1):900-910.
APA Chaofeng Ye,Na Zhang,Lei Peng,&Yu Tao.(2022).Flexible Array Probe With In-Plane Differential Multichannels for Inspection of Microdefects on Curved Surface.IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,69(1),900-910.
MLA Chaofeng Ye,et al."Flexible Array Probe With In-Plane Differential Multichannels for Inspection of Microdefects on Curved Surface".IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS 69.1(2022):900-910.
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