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ShanghaiTech University Knowledge Management System
Atomic-scale study of nanocatalysts by aberration-corrected electron microscopy | |
2020-09-30 | |
发表期刊 | JOURNAL OF PHYSICS-CONDENSED MATTER (IF:2.3[JCR-2023],2.2[5-Year]) |
ISSN | 0953-8984 |
卷号 | 32期号:41 |
发表状态 | 已发表 |
DOI | 10.1088/1361-648X/ab977c |
摘要 | Aberration-corrected electron microscopy (AC-EM) including transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) has become one of the most powerful technologies in the studies of nanocatalysts. With the current spatial resolution of sub-0.5 angstrom and energy resolution of 10 meV, AC-EM can quantificationally articulate the connection between catalytic properties and atomic configurations of nanocatalysts. However, the restricted irradiation sensitive characteristics of specimens pose an obstacle to solve their intrinsic structure. Low-dose imaging should be applied to overcome this problem. In addition, the choice of appropriate imaging method is also crucial to tackle specific structural problems of nanocatalysts. On the basis of careful management of electron dose and selection of suitable imaging method,in situgas and liquid S/TEM are able to reveal the structure evolution of nanocatalysts in real-time. Further combination with residual gas analysis would deepen the understanding of the catalytic reaction. |
关键词 | aberration-corrected electron microscopy nanocatalysts atomic-scale in situ low dose radiation damage |
收录类别 | SCI ; SCIE ; EI |
WOS研究方向 | Physics |
WOS类目 | Physics, Condensed Matter |
WOS记录号 | WOS:000553787600001 |
出版者 | IOP PUBLISHING LTD |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/123522 |
专题 | 物质科学与技术学院_硕士生 物质科学与技术学院_PI研究组_于奕组 物质科学与技术学院_博士生 |
通讯作者 | Yu, Yi |
作者单位 | ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Zhang, Xun,Zhang, Xiuli,Yuan, Biao,et al. Atomic-scale study of nanocatalysts by aberration-corrected electron microscopy[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2020,32(41). |
APA | Zhang, Xun,Zhang, Xiuli,Yuan, Biao,Liang, Chao,&Yu, Yi.(2020).Atomic-scale study of nanocatalysts by aberration-corrected electron microscopy.JOURNAL OF PHYSICS-CONDENSED MATTER,32(41). |
MLA | Zhang, Xun,et al."Atomic-scale study of nanocatalysts by aberration-corrected electron microscopy".JOURNAL OF PHYSICS-CONDENSED MATTER 32.41(2020). |
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