An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures

doi:10.3390/ma12071141

	An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures
	Ma, Jiayu1,2,3 ; Zhang, Yuzhi 1,2; Wu, Lingnan 1; Li, Haogeng 1,2; Song, Lixin 1,2
	2019-04-10
发表期刊	MATERIALS
ISSN	1996-1944
卷号	12 期号:7
发表状态	已发表
DOI	10.3390/ma12071141
摘要	Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 m at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K.
关键词	spectral emissivity radiation vacuum low temperature
收录类别	SCI ; SCIE ; EI
语种	英语
WOS研究方向	Materials Science
WOS类目	Materials Science, Multidisciplinary
WOS记录号	WOS:000465500700140
出版者	MDPI
EI入藏号	20192006939298
EI主题词	Electromagnetic wave emission ; Emission spectroscopy ; Fourier series ; Heat radiation ; Modulation ; Temperature ; Thermal variables control ; Vacuum
EI分类号	Vacuum Technology:633 ; Thermodynamics:641.1 ; Heat Transfer:641.2 ; Electromagnetic Waves:711 ; Specific Variables Control:731.3 ; Chemistry:801 ; Mathematical Transformations:921.3
WOS关键词	VACUUM ; AMPLIFIER ; CAVITY ; STEEL ; RANGE
原始文献类型	Article
引用统计
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/34337
专题	物质科学与技术学院_硕士生
通讯作者	Zhang, Yuzhi
作者单位	1.Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Coating Mat CAS, Shanghai 200050, Peoples R China 2.Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China 3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
第一作者单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,et al. An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures[J]. MATERIALS,2019,12(7).
APA	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,Li, Haogeng,&Song, Lixin.(2019).An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures.MATERIALS,12(7).
MLA	Ma, Jiayu,et al."An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures".MATERIALS 12.7(2019).