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PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition 会议论文
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), Valencia, Spain, 25-27 March 2024
作者:  Hongquan He;  Guowen Kuang;  Qi Sun;  Hao Geng
Adobe PDF(8911Kb)  |  收藏  |  浏览/下载:317/3  |  提交时间:2024/06/17
Wafer-Scale Epitaxial Growth of the Thickness-Controllable Van Der Waals Ferromagnet CrTe2 for Reliable Magnetic Memory Applications 期刊论文
ADVANCED FUNCTIONAL MATERIALS, 2023, 卷号: 33, 期号: 50
作者:  Liu, Xinqi;  Huang, Puyang;  Xia, Yunyouyou;  Gao, Lei;  Liao, Liyang
Adobe PDF(1145Kb)  |  收藏  |  浏览/下载:974/314  |  提交时间:2023/09/22
Patterning of Wafer-Scale MXene Films for High-Performance Image Sensor Arrays 期刊论文
ADVANCED MATERIALS, 2022
作者:  Li, Bo;  Zhu, Qian-Bing;  Cui, Cong;  Liu, Chi;  Wang, Zuo-Hua
Adobe PDF(3617Kb)  |  收藏  |  浏览/下载:348/0  |  提交时间:2022/04/02
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