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Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 卷号: 29, 期号: 5
作者:  Chen, Tinghuan;  Geng, Hao;  Sun, Qi;  Wan, Sanping;  Sun, Yongsheng
Adobe PDF(25Kb)  |  收藏  |  浏览/下载：287/29  |  提交时间：2024/10/25
Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR metrics 会议论文
IEEE/ACM PROCEEDINGS DESIGN, AUTOMATION AND TEST IN EUROPE (DATE), Valencia, Spain, 25-27 March 2024
作者:  Donger Luo;  Qi Sun;  Qi Xu;  Tinghuan Chen;  Geng H(耿浩)
Adobe PDF(931Kb)  |  收藏  |  浏览/下载：362/3  |  提交时间：2024/04/06
Fast Constraints Tuning via Transfer Learning and Multi-Objective Optimization 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:  Meng Zhang;  Zheng Zhang;  Yifan Niu;  Jiayi Li;  Zewei Chen
Adobe PDF(10609Kb)  |  收藏  |  浏览/下载：342/2  |  提交时间：2024/03/29
Mixed-Type Wafer Failure Pattern Recognition 会议论文
PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC, Tokyo, Japan, January 16, 2023 - January 19, 2023
作者:  Geng, Hao;  Sun, Qi;  Chen, Tinghuan;  Xu, Qi;  Ho, Tsung-Yi
Adobe PDF(2023Kb)  |  收藏  |  浏览/下载：256/2  |  提交时间：2023/03/10
Mixed-Type Wafer Failure Pattern Recognition (Invited Paper) 会议论文
2023 28TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), Tokyo, Japan, 16-19 Jan. 2023
作者:  Hao Geng;  Qi Sun;  Tinghuan Chen;  Qi Xu;  Tsung-Yi Ho
Adobe PDF(1271Kb)  |  收藏  |  浏览/下载：95/1  |  提交时间：2024/09/18
PTPT: Physical Design Tool Parameter Tuning via Multi-Objective Bayesian Optimization 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 1, 页码: 178-189
作者:  Hao Geng;  Tinghuan Chen;  Yuzhe Ma;  Binwu Zhu;  Bei Yu
Adobe PDF(11011Kb)  |  收藏  |  浏览/下载：283/3  |  提交时间：2022/05/20
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