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An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials | |
2025-08 | |
发表期刊 | ULTRAMICROSCOPY (IF:2.1[JCR-2023],2.3[5-Year]) |
ISSN | 0304-3991 |
EISSN | 1879-2723 |
卷号 | 274 |
发表状态 | 已发表 |
DOI | 10.1016/j.ultramic.2025.114154 |
摘要 | High-resolution transmission electron microscopy (HRTEM) is a widely-used technique for atomic-scale characterization. However, the conventional dose of HRTEM can destroy beam-sensitive materials such as organic-inorganic halide perovskites. CH3NH3PbI3 (MAPbI(3)), a typical perovskite, will be easily damaged after irradiated with the dose of similar to 10(2) e-/& Aring;(2). Low-dose imaging techniques can protect the specimen but it is difficult to achieve an image which is both directly interpreted and atomically clear. Exit wave reconstruction (EWR), as one of phase retrieval methods, can recover an interpretable phase image at the atomic scale but its signal-to-noise ratio (SNR) is limited by low electron doses. Here, we improve the iterative wave function reconstruction (IWFR) method and present a soft-thresholding L-1-IWFR. Results from both simulated and experimental focal-series dataset at the extremely low dose show that L-1-IWFR improves the SNR effectively and has better performance on low-dose datasets than IWFR. Combined with low-dose imaging techniques and various alignment strategies, an atomically clear image of CH3NH3PbI3 (MAPbI(3)) is successfully achieved at the total dose of similar to 45 e(-)/& Aring;(2). |
关键词 | High-resolution transmission electron microscopy Exit wave reconstruction Phase retrieval Low-dose imaging Organic-inorganic halide perovskites |
URL | 查看原文 |
收录类别 | SCI ; EI |
语种 | 英语 |
资助项目 | National Natural Science Foundation of China[52222311] |
WOS研究方向 | Microscopy |
WOS类目 | Microscopy |
WOS记录号 | WOS:001491278400001 |
出版者 | ELSEVIER |
EI入藏号 | 20251918389166 |
EI主题词 | Electron microscopy |
EI分类号 | 1301.3.1 Microscopy |
原始文献类型 | Journal article (JA) |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/533645 |
专题 | 物质科学与技术学院 物质科学与技术学院_PI研究组_于奕组 物质科学与技术学院_博士生 |
通讯作者 | Yu, Yi |
作者单位 | 1.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China 2.ShanghaiTech Univ, Shanghai Key Lab High Resolut Electron Microscopy, Shanghai 201210, Peoples R China 3.Univ Sci & Technol China, Sch Chem & Mat Sci, Key Lab Precis & Intelligent Chem, Dept Mat Sci & Engn, Hefei 230026, Peoples R China |
第一作者单位 | 物质科学与技术学院; 上海科技大学 |
通讯作者单位 | 物质科学与技术学院; 上海科技大学 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Shi, Hongsheng,Lu, Yuan,Wang, Zeyu,et al. An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials[J]. ULTRAMICROSCOPY,2025,274. |
APA | Shi, Hongsheng,Lu, Yuan,Wang, Zeyu,Zhang, Shuchen,&Yu, Yi.(2025).An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials.ULTRAMICROSCOPY,274. |
MLA | Shi, Hongsheng,et al."An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials".ULTRAMICROSCOPY 274(2025). |
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