A Temperature Compensation Method for Micron Level Measurement of Oxide Film Thickness
2024-07-31
会议录名称2024 ACADEMIC CONFERENCE OF CHINA INSTRUMENT AND CONTROL SOCIETY (ACCIS)
页码14-19
发表状态已发表
DOI10.1109/ACCIS62068.2024.10948595
摘要

Accurate measurement of oxide film thickness on the surface of fuel cladding is of great significance for maintaining the safety of nuclear power plants. Eddy current testing (ECT) is the most commonly used technology for the pool-side measurement of the oxide film thickness, which has the merits of high sensitivity and resistance to irradiation. However, the measurement error of the ECT sensor will occur because the temperature of the fuel cladding is unknown. To improve the sensor performance, this paper presents a temperature compensation method. First, the influences of temperature fluctuation on the coil impedance are analyzed. Then, a temperature compensation method is proposed based on the approximately linear signal characteristics. The feasibility of the proposed method is demonstrated by measuring the oxide thickness at different temperatures. The experimental results show that the measurement error is reduced by over 80% and the compensation error is less than 7.25μm.

会议录编者/会议主办者Chinese Instrument and Control Society (CIS)
关键词Eddy current testing Level measurement Nuclear fuel cladding Phase measurement Strain measurement Thickness gages Thickness measurement Velocity measurement Compensation method Eddy-current testing Film thickness measurement Fuel cladding Measurements of Micron level Oxide film thickness Oxide film thickness measurement Pool-side inspection Temperature compensation
会议名称2024 Academic Conference of China Instrument and Control Society, ACCIS 2024
会议地点Chengdu, China
会议日期28-31 July 2024
URL查看原文
收录类别EI
语种英语
出版者Institute of Electrical and Electronics Engineers Inc.
EI入藏号20251718309621
EI主题词Nuclear power plants
EI分类号208.1 Coating Techniques ; 215.2.1 Non-mechanical Properties Testing Equipment and Methods ; 941.3 Electric Variables Measurements ; 941.5 Mechanical Variables Measurements ; 942.1.7 Special Purpose Instruments ; 1001 Nuclear Energy and Technology
原始文献类型Conference article (CA)
来源库IEEE
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/514103
专题信息科学与技术学院
信息科学与技术学院_PI研究组_叶朝锋组
信息科学与技术学院_硕士生
信息科学与技术学院_博士生
作者单位
1.School of Information Science and Technology ShanghaiTech University, Shanghai, China
2.China General Nuclear Power Group, CGN Inspection Technology Company Ltd, Shenzhen, China
第一作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
推荐引用方式
GB/T 7714
Jiarui Feng,Xiaoguang Li,Guozheng Zhou,et al. A Temperature Compensation Method for Micron Level Measurement of Oxide Film Thickness[C]//Chinese Instrument and Control Society (CIS):Institute of Electrical and Electronics Engineers Inc.,2024:14-19.
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