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A Temperature Compensation Method for Micron Level Measurement of Oxide Film Thickness | |
2024-07-31 | |
会议录名称 | 2024 ACADEMIC CONFERENCE OF CHINA INSTRUMENT AND CONTROL SOCIETY (ACCIS)
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页码 | 14-19 |
发表状态 | 已发表 |
DOI | 10.1109/ACCIS62068.2024.10948595 |
摘要 | Accurate measurement of oxide film thickness on the surface of fuel cladding is of great significance for maintaining the safety of nuclear power plants. Eddy current testing (ECT) is the most commonly used technology for the pool-side measurement of the oxide film thickness, which has the merits of high sensitivity and resistance to irradiation. However, the measurement error of the ECT sensor will occur because the temperature of the fuel cladding is unknown. To improve the sensor performance, this paper presents a temperature compensation method. First, the influences of temperature fluctuation on the coil impedance are analyzed. Then, a temperature compensation method is proposed based on the approximately linear signal characteristics. The feasibility of the proposed method is demonstrated by measuring the oxide thickness at different temperatures. The experimental results show that the measurement error is reduced by over 80% and the compensation error is less than 7.25μm. |
会议录编者/会议主办者 | Chinese Instrument and Control Society (CIS) |
关键词 | Eddy current testing Level measurement Nuclear fuel cladding Phase measurement Strain measurement Thickness gages Thickness measurement Velocity measurement Compensation method Eddy-current testing Film thickness measurement Fuel cladding Measurements of Micron level Oxide film thickness Oxide film thickness measurement Pool-side inspection Temperature compensation |
会议名称 | 2024 Academic Conference of China Instrument and Control Society, ACCIS 2024 |
会议地点 | Chengdu, China |
会议日期 | 28-31 July 2024 |
URL | 查看原文 |
收录类别 | EI |
语种 | 英语 |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
EI入藏号 | 20251718309621 |
EI主题词 | Nuclear power plants |
EI分类号 | 208.1 Coating Techniques ; 215.2.1 Non-mechanical Properties Testing Equipment and Methods ; 941.3 Electric Variables Measurements ; 941.5 Mechanical Variables Measurements ; 942.1.7 Special Purpose Instruments ; 1001 Nuclear Energy and Technology |
原始文献类型 | Conference article (CA) |
来源库 | IEEE |
文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/514103 |
专题 | 信息科学与技术学院 信息科学与技术学院_PI研究组_叶朝锋组 信息科学与技术学院_硕士生 信息科学与技术学院_博士生 |
作者单位 | 1.School of Information Science and Technology ShanghaiTech University, Shanghai, China 2.China General Nuclear Power Group, CGN Inspection Technology Company Ltd, Shenzhen, China |
第一作者单位 | 信息科学与技术学院 |
第一作者的第一单位 | 信息科学与技术学院 |
推荐引用方式 GB/T 7714 | Jiarui Feng,Xiaoguang Li,Guozheng Zhou,et al. A Temperature Compensation Method for Micron Level Measurement of Oxide Film Thickness[C]//Chinese Instrument and Control Society (CIS):Institute of Electrical and Electronics Engineers Inc.,2024:14-19. |
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