A Precise Oxide Film Thickness Measurement Method Based on Swept Frequency and Transmission Cable Impedance Correction
2025-01
发表期刊SENSORS (IF:3.4[JCR-2023],3.7[5-Year])
ISSN1424-8220
EISSN1424-8220
卷号25期号:2
发表状态已发表
DOI10.3390/s25020579
摘要

Accurately measuring the thickness of the oxide film that accumulates on nuclear fuel assemblies is critical for maintaining nuclear power plant safety. Oxide film thickness typically ranges from a few micrometers to several tens of micrometers, necessitating a high-precision measurement system. Eddy current testing (ECT) is commonly employed during poolside inspections due to its simplicity and ease of on-site implementation. The use of swept frequency technology can mitigate the impact of interference parameters and improve the measurement accuracy of ECT. However, as the nuclear assembly is placed in a pool for inspection, a cable several dozen meters in length is used to connect the ECT probe to the instrument. The measurement is affected by the transmission line and its effect is a function of the operating frequencies, resulting in errors for swept frequency measurements. This paper proposes a method for precisely measuring oxide film thickness based on the swept frequency technique and long transmission line impedance correction. The signals are calibrated based on a transmission line model of the cable, effectively eliminating the influence of the transmission cable. A swept frequency signal-processing algorithm is developed to separate the parameters and calculate oxide film thickness. To verify the feasibility of the method, measurements are conducted on fuel cladding samples with varying conductivities. It is found that the method can accurately assess oxide film thickness with varying conductivity. The maximum error is 3.42 μm, while the average error is 1.82 μm. The impedance correction reduces the error by 66%. The experimental results indicate that this method can eliminate the impact of long transmission cables, and the algorithm can mitigate the influence of material conductivity. This method can be utilized to measure oxide film thickness in nuclear power maintenance inspections following extensive testing and engineering optimization. © 2025 by the authors.

关键词Electric frequency measurement Electric impedance measurement Mass spectrometry Micrometers Phase measurement Process monitoring Strain measurement Thickness gages Thickness measurement Velocity measurement Eddy current testing Eddy-current testing Film thickness measurement Impedance correction Oxide film thickness Oxide film thickness measurement Sweep frequencies Swept-frequency Transmission cables Transmission line modeling
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收录类别SCI ; EI
语种英语
资助项目null[U23B20113] ; null[52277014]
WOS研究方向Chemistry ; Engineering ; Instruments & Instrumentation
WOS类目Chemistry, Analytical ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号WOS:001405336600001
出版者Multidisciplinary Digital Publishing Institute (MDPI)
EI入藏号20250417759422
EI主题词Eddy current testing
EI分类号1301.1.3.1 ; 215.2.1 ; 805 Chemical Engineering, General ; 913.3 Quality Assurance and Control ; 941.3 Optical Instruments ; 941.5 ; 942.1.6 ; 942.1.7
原始文献类型Journal article (JA)
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/483850
专题信息科学与技术学院
信息科学与技术学院_PI研究组_叶朝锋组
信息科学与技术学院_硕士生
通讯作者Ye, Chaofeng
作者单位
1.School of Information Science and Technology, ShanghaiTech University, Shanghai; 201210, China;
2.Department of Electrical, Tsinghua University, Beijing; 100084, China
第一作者单位信息科学与技术学院
通讯作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
推荐引用方式
GB/T 7714
Li, Yifan,Xiao, Qi,Peng, Lisha,et al. A Precise Oxide Film Thickness Measurement Method Based on Swept Frequency and Transmission Cable Impedance Correction[J]. SENSORS,2025,25(2).
APA Li, Yifan,Xiao, Qi,Peng, Lisha,Huang, Songling,&Ye, Chaofeng.(2025).A Precise Oxide Film Thickness Measurement Method Based on Swept Frequency and Transmission Cable Impedance Correction.SENSORS,25(2).
MLA Li, Yifan,et al."A Precise Oxide Film Thickness Measurement Method Based on Swept Frequency and Transmission Cable Impedance Correction".SENSORS 25.2(2025).
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