ShanghaiTech University Knowledge Management System
Knowing The Spec to Explore The Design via Transformed Bayesian Optimization | |
2024-11-07 | |
会议录名称 | PROCEEDINGS - DESIGN AUTOMATION CONFERENCE |
ISSN | 0738-100X |
发表状态 | 已发表 |
DOI | 10.1145/3649329.3658262 |
摘要 | AI chip scales expediently in the large language models (LLMs) era. In contrast, the existing chip design space exploration (DSE) methods, aimed at discovering optimal yet often infeasible or un-produceable Pareto-front designs, are hindered by neglect of design specifications. In this paper, we propose a novel Spec-driven transformed Bayesian optimization framework to find expected optimal RISC-V SoC architecture designs for LLM tasks. The highlights of our framework lie in a tailored transformed Gaussian process (GP) model prioritizing specified target metrics and a customized acquisition function (EHRM) in multi-objective optimization. Extensive experiments on large-scale RISC-V SoC architecture design explorations for LLMs, such as Transformer, BERT, and GPT-1, demonstrate that our method not only can effectively find the design according to QoR values from the spec, but also outperforms 34.59% in ADRS over state-of-the-art approach with only 66.67% runtime overhead. © 2024 Copyright is held by the owner/author(s). Publication rights licensed to ACM. |
会议录编者/会议主办者 | ACM Special Interest Group on Design Automation (SIGDA) ; ACM Special Interest Group on Embedded Systems (SIGBED) ; IEEE-CEDA |
关键词 | Gaussian distribution Integrated circuit design Optimal systems Pareto principle Printed circuit design Problem oriented languages Space applications System-on-chip Architecture designs Bayesian optimization Chip design Chip-scale Design space exploration Design specification Exploration methods Language model Pareto front SoC architecture |
会议名称 | 61st ACM/IEEE Design Automation Conference, DAC 2024 |
会议地点 | San Francisco, CA, United states |
会议日期 | June 23, 2024 - June 27, 2024 |
收录类别 | EI |
语种 | 英语 |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
EI入藏号 | 20245017501506 |
EI主题词 | Space research |
EI分类号 | 1102.3.1 ; 1106.1.1 ; 1201.7 ; 1202.1 ; 1202.2 ; 656 Space Flight ; 656.2 Space Research ; 713 Electronic Circuits ; 714.2 Semiconductor Devices and Integrated Circuits ; 904 ; 913.6 Product Development ; Concurrent Engineering ; 961 Systems Science |
原始文献类型 | Conference article (CA) |
文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/461535 |
专题 | 上海科技大学 |
通讯作者 | Hao, Geng |
作者单位 | 1.ShanghaiTech University, China; 2.Zhejiang University, China; 3.Chinese University of Hong Kong, Hong Kong; 4.Shanghai Engineering Research Center of Energy Efficient and Custom Ai Ic, China |
第一作者单位 | 上海科技大学 |
通讯作者单位 | 上海科技大学 |
第一作者的第一单位 | 上海科技大学 |
推荐引用方式 GB/T 7714 | Donger, Luo,Qi, Sun,Xinheng, Li,et al. Knowing The Spec to Explore The Design via Transformed Bayesian Optimization[C]//ACM Special Interest Group on Design Automation (SIGDA), ACM Special Interest Group on Embedded Systems (SIGBED), IEEE-CEDA:Institute of Electrical and Electronics Engineers Inc.,2024. |
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