KMS
Knowing The Spec to Explore The Design via Transformed Bayesian Optimization
2024-11-07
会议录名称PROCEEDINGS - DESIGN AUTOMATION CONFERENCE
ISSN0738-100X
发表状态已发表
DOI10.1145/3649329.3658262
摘要

AI chip scales expediently in the large language models (LLMs) era. In contrast, the existing chip design space exploration (DSE) methods, aimed at discovering optimal yet often infeasible or un-produceable Pareto-front designs, are hindered by neglect of design specifications. In this paper, we propose a novel Spec-driven transformed Bayesian optimization framework to find expected optimal RISC-V SoC architecture designs for LLM tasks. The highlights of our framework lie in a tailored transformed Gaussian process (GP) model prioritizing specified target metrics and a customized acquisition function (EHRM) in multi-objective optimization. Extensive experiments on large-scale RISC-V SoC architecture design explorations for LLMs, such as Transformer, BERT, and GPT-1, demonstrate that our method not only can effectively find the design according to QoR values from the spec, but also outperforms 34.59% in ADRS over state-of-the-art approach with only 66.67% runtime overhead. © 2024 Copyright is held by the owner/author(s). Publication rights licensed to ACM.

会议录编者/会议主办者ACM Special Interest Group on Design Automation (SIGDA) ; ACM Special Interest Group on Embedded Systems (SIGBED) ; IEEE-CEDA
关键词Gaussian distribution Integrated circuit design Optimal systems Pareto principle Printed circuit design Problem oriented languages Space applications System-on-chip Architecture designs Bayesian optimization Chip design Chip-scale Design space exploration Design specification Exploration methods Language model Pareto front SoC architecture
会议名称61st ACM/IEEE Design Automation Conference, DAC 2024
会议地点San Francisco, CA, United states
会议日期June 23, 2024 - June 27, 2024
收录类别EI
语种英语
出版者Institute of Electrical and Electronics Engineers Inc.
EI入藏号20245017501506
EI主题词Space research
EI分类号1102.3.1 ; 1106.1.1 ; 1201.7 ; 1202.1 ; 1202.2 ; 656 Space Flight ; 656.2 Space Research ; 713 Electronic Circuits ; 714.2 Semiconductor Devices and Integrated Circuits ; 904 ; 913.6 Product Development ; Concurrent Engineering ; 961 Systems Science
原始文献类型Conference article (CA)
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/461535
专题上海科技大学
通讯作者Hao, Geng
作者单位
1.ShanghaiTech University, China;
2.Zhejiang University, China;
3.Chinese University of Hong Kong, Hong Kong;
4.Shanghai Engineering Research Center of Energy Efficient and Custom Ai Ic, China
第一作者单位上海科技大学
通讯作者单位上海科技大学
第一作者的第一单位上海科技大学
推荐引用方式
GB/T 7714
Donger, Luo,Qi, Sun,Xinheng, Li,et al. Knowing The Spec to Explore The Design via Transformed Bayesian Optimization[C]//ACM Special Interest Group on Design Automation (SIGDA), ACM Special Interest Group on Embedded Systems (SIGBED), IEEE-CEDA:Institute of Electrical and Electronics Engineers Inc.,2024.
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