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ShanghaiTech University Knowledge Management System
Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes | |
2024-07-29 | |
发表期刊 | APPLIED PHYSICS LETTERS (IF:3.5[JCR-2023],3.5[5-Year]) |
ISSN | 0003-6951 |
EISSN | 1077-3118 |
卷号 | 125期号:5 |
发表状态 | 已发表 |
DOI | 10.1063/5.0219365 |
摘要 | Direct observation of intrinsic atom migration inside bulk materials is crucial for understanding the ion-conducting property; however, microscopy experiments remain challenging. Here, intrinsic atom migration in bulk lithium-ion conductor La2/3-xLi3xTiO3 was investigated by using aberration-corrected transmission electron microscopy. The atomic migration was triggered by high-energy electron beam irradiation. Through quantitative analysis of high-angle annular dark-field image sequences and estimation of random errors using the 3σ criterion, the subtle contrast variation caused by single atom migration was extracted, in which the validity was further confirmed by image simulations. It provides a simple and feasible methodology for investigating the mechanism of atomic migration in bulk materials. © 2024 Author(s). |
关键词 | Atoms High resolution transmission electron microscopy Ions Lithium compounds Materials handling equipment Solid electrolytes Atom migration Atomic migration Bulk materials Conducting oxides Direct observations Ion conducting properties Ion-conducting Lithium ions Lithium-ion conductor Oxide solid electrolytes |
URL | 查看原文 |
收录类别 | SCI ; EI |
语种 | 英语 |
资助项目 | National Natural Science Foundation of China[52222311] |
WOS研究方向 | Physics |
WOS类目 | Physics, Applied |
WOS记录号 | WOS:001283011600023 |
出版者 | American Institute of Physics |
EI入藏号 | 20243216849742 |
EI主题词 | Random errors |
EI分类号 | 691.1 Materials Handling Equipment ; 741.3 Optical Devices and Systems ; 803 Chemical Agents and Basic Industrial Chemicals ; 931.3 Atomic and Molecular Physics |
原始文献类型 | Journal article (JA) |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/411234 |
专题 | 物质科学与技术学院 物质科学与技术学院_PI研究组_于奕组 物质科学与技术学院_硕士生 物质科学与技术学院_博士生 |
通讯作者 | Yu, Yi |
作者单位 | School of Physical Science and Technology, Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai; 201210, China |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Hu, Xiangchen,Shi, Hongsheng,Wu, Xiaoyan,et al. Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes[J]. APPLIED PHYSICS LETTERS,2024,125(5). |
APA | Hu, Xiangchen,Shi, Hongsheng,Wu, Xiaoyan,Wang, Zeyu,&Yu, Yi.(2024).Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes.APPLIED PHYSICS LETTERS,125(5). |
MLA | Hu, Xiangchen,et al."Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes".APPLIED PHYSICS LETTERS 125.5(2024). |
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