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Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes
2024-07-29
发表期刊APPLIED PHYSICS LETTERS (IF:3.5[JCR-2023],3.5[5-Year])
ISSN0003-6951
EISSN1077-3118
卷号125期号:5
发表状态已发表
DOI10.1063/5.0219365
摘要

Direct observation of intrinsic atom migration inside bulk materials is crucial for understanding the ion-conducting property; however, microscopy experiments remain challenging. Here, intrinsic atom migration in bulk lithium-ion conductor La2/3-xLi3xTiO3 was investigated by using aberration-corrected transmission electron microscopy. The atomic migration was triggered by high-energy electron beam irradiation. Through quantitative analysis of high-angle annular dark-field image sequences and estimation of random errors using the 3σ criterion, the subtle contrast variation caused by single atom migration was extracted, in which the validity was further confirmed by image simulations. It provides a simple and feasible methodology for investigating the mechanism of atomic migration in bulk materials. © 2024 Author(s).

关键词Atoms High resolution transmission electron microscopy Ions Lithium compounds Materials handling equipment Solid electrolytes Atom migration Atomic migration Bulk materials Conducting oxides Direct observations Ion conducting properties Ion-conducting Lithium ions Lithium-ion conductor Oxide solid electrolytes
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收录类别SCI ; EI
语种英语
资助项目National Natural Science Foundation of China[52222311]
WOS研究方向Physics
WOS类目Physics, Applied
WOS记录号WOS:001283011600023
出版者American Institute of Physics
EI入藏号20243216849742
EI主题词Random errors
EI分类号691.1 Materials Handling Equipment ; 741.3 Optical Devices and Systems ; 803 Chemical Agents and Basic Industrial Chemicals ; 931.3 Atomic and Molecular Physics
原始文献类型Journal article (JA)
文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/411234
专题物质科学与技术学院
物质科学与技术学院_PI研究组_于奕组
物质科学与技术学院_硕士生
物质科学与技术学院_博士生
通讯作者Yu, Yi
作者单位
School of Physical Science and Technology, Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai; 201210, China
第一作者单位物质科学与技术学院
通讯作者单位物质科学与技术学院
第一作者的第一单位物质科学与技术学院
推荐引用方式
GB/T 7714
Hu, Xiangchen,Shi, Hongsheng,Wu, Xiaoyan,et al. Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes[J]. APPLIED PHYSICS LETTERS,2024,125(5).
APA Hu, Xiangchen,Shi, Hongsheng,Wu, Xiaoyan,Wang, Zeyu,&Yu, Yi.(2024).Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes.APPLIED PHYSICS LETTERS,125(5).
MLA Hu, Xiangchen,et al."Quantitative analysis of atomic migration in lithium-ion conducting oxide solid electrolytes".APPLIED PHYSICS LETTERS 125.5(2024).
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