Open-Source Differentiable Lithography Imaging Framework
2024
会议录名称PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
ISSN0277-786X
卷号12954
发表状态已发表
DOI10.1117/12.3009980
摘要

The rapid evolution of the electronics industry, driven by Moore’s law and the proliferation of integrated circuits, has led to significant advancements in modern society, including the Internet, wireless communication, and artificial intelligence (AI). Central to this progress is optical lithography, a critical technology in semiconductor manufacturing that accounts for approximately 30% to 40% of production costs. As semiconductor nodes shrink and transistor numbers increase, optical lithography becomes increasingly vital in current integrated circuit (IC) fabrication technology. This paper introduces an open-source differentiable lithography imaging framework that leverages the principles of differentiable programming and the computational power of GPUs to enhance the precision of lithography modeling and simplify the optimization of resolution enhancement techniques (RETs). The framework models the core components of lithography as differentiable segments, allowing for the implementation of standard scalar imaging models, including the Abbe and Hopkins models, as well as their approximation models. The paper introduces a computational lithography framework that optimizes semiconductor manufacturing processes using advanced computational techniques and differentiable programming. It compares imaging models and provides tools for enhancing resolution, demonstrating improved semiconductor patterning performance. The open-sourced framework represents a significant advancement in lithography technology, facilitating collaboration in the field. The source code is available at https://github.com/TorchOPC/TorchLitho. © 2024 SPIE. All rights reserved.

会议录编者/会议主办者The Society of Photo-Optical Instrumentation Engineers (SPIE)
关键词HTTP Integrated circuits Open source software Photolithography Program processors Semiconductor device manufacture Computational lithographies Critical technologies Differentiable programming Electronic industries Imaging modeling Machine-learning Open-source Production cost Semiconductor manufacturing Wireless communications
会议名称DTCO and Computational Patterning III 2024
出版地1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
会议地点San Jose, CA, United states
会议日期February 26, 2024 - February 29, 2024
URL查看原文
收录类别EI ; CPCI-S
语种英语
WOS研究方向Computer Science ; Engineering
WOS类目Computer Science, Interdisciplinary Applications ; Engineering, Manufacturing ; Engineering, Electrical & Electronic
WOS记录号WOS:001224292100016
出版者SPIE
EI入藏号20242016093131
EI主题词Machine learning
EISSN1996-756X
EI分类号714.2 Semiconductor Devices and Integrated Circuits ; 723 Computer Software, Data Handling and Applications ; 723.4 Artificial Intelligence
原始文献类型Conference article (CA)
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/375724
专题信息科学与技术学院_PI研究组_耿浩
作者单位
1.The Chinese University of Hong Kong, Hong Kong;
2.The University of Texas, Austin, United States;
3.ShanghaiTech University, China
推荐引用方式
GB/T 7714
Chen, Guojin,Geng, Hao,Yu, Bei,et al. Open-Source Differentiable Lithography Imaging Framework[C]//The Society of Photo-Optical Instrumentation Engineers (SPIE). 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE,2024.
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