High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection
2024-04-18
发表期刊INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS (IF:1.1[JCR-2023],0.7[5-Year])
ISSN1383-5416
EISSN1875-8800
卷号74期号:4页码:299-306
发表状态已发表
DOI10.3233/JAE-230115
摘要

It is still a challenging problem to detect small defects for eddy current array probes, which requires the probes to possess excellent sensitivity, as well as high spatial resolution. This paper presents a novel high-resolution magnetic field imaging probe with two rows of tunneling magnetoresistance (TMR) array sensors. The bare die sensors are integrated on a printed circuit board by golden wire bonding technology. The two rows of sensors are placed staggered with each other. The data of the two arrays are merged into a matrix, in which way the image pixel pitch is increased to 0.25 mm. The probe employs a differential scheme to suppress the noise, so as to detect the weak signal of small defects. To highlight the weak defect indications, feature extraction and segmentation algorithms are developed. The experimental results confirm that the proposed method can inspect a small defect with dimensions 1 mm (length) × 0.1 mm (width) × 0.1 mm (depth) on a stainless-steel sample. © 2024 - IOS Press. All rights reserved.

关键词Defects Eddy current testing Feature extraction Printed circuit boards Probes Array probe Defects inspections Differential measurements Eddy current testing Eddy-current testing High resolution Images segmentations Imaging probe Magnetic field imaging Tunneling magnetoresistance sensors
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收录类别SCI ; EI
语种英语
WOS研究方向Engineering ; Mechanics ; Physics
WOS类目Engineering, Electrical & Electronic ; Mechanics ; Physics, Applied
WOS记录号WOS:001208837700002
出版者IOS Press BV
EI入藏号20241715975720
EI主题词Image segmentation
EI分类号951 Materials Science
原始文献类型Journal article (JA)
文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/370097
专题信息科学与技术学院
信息科学与技术学院_PI研究组_叶朝锋组
信息科学与技术学院_硕士生
通讯作者Long, Cai; Ye, Chaofeng
作者单位
1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China
2.Yangjiang Nuclear Power Co. Ltd., Guangdong, China
第一作者单位信息科学与技术学院
通讯作者单位信息科学与技术学院
第一作者的第一单位信息科学与技术学院
推荐引用方式
GB/T 7714
Long, Cai,Wang, Yuanyuan,Dong, Haoran,et al. High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection[J]. INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS,2024,74(4):299-306.
APA Long, Cai,Wang, Yuanyuan,Dong, Haoran,Tao, Yu,&Ye, Chaofeng.(2024).High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection.INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS,74(4),299-306.
MLA Long, Cai,et al."High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection".INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS 74.4(2024):299-306.
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