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High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection | |
2024-04-18 | |
发表期刊 | INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS (IF:1.1[JCR-2023],0.7[5-Year]) |
ISSN | 1383-5416 |
EISSN | 1875-8800 |
卷号 | 74期号:4页码:299-306 |
发表状态 | 已发表 |
DOI | 10.3233/JAE-230115 |
摘要 | It is still a challenging problem to detect small defects for eddy current array probes, which requires the probes to possess excellent sensitivity, as well as high spatial resolution. This paper presents a novel high-resolution magnetic field imaging probe with two rows of tunneling magnetoresistance (TMR) array sensors. The bare die sensors are integrated on a printed circuit board by golden wire bonding technology. The two rows of sensors are placed staggered with each other. The data of the two arrays are merged into a matrix, in which way the image pixel pitch is increased to 0.25 mm. The probe employs a differential scheme to suppress the noise, so as to detect the weak signal of small defects. To highlight the weak defect indications, feature extraction and segmentation algorithms are developed. The experimental results confirm that the proposed method can inspect a small defect with dimensions 1 mm (length) × 0.1 mm (width) × 0.1 mm (depth) on a stainless-steel sample. © 2024 - IOS Press. All rights reserved. |
关键词 | Defects Eddy current testing Feature extraction Printed circuit boards Probes Array probe Defects inspections Differential measurements Eddy current testing Eddy-current testing High resolution Images segmentations Imaging probe Magnetic field imaging Tunneling magnetoresistance sensors |
URL | 查看原文 |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS研究方向 | Engineering ; Mechanics ; Physics |
WOS类目 | Engineering, Electrical & Electronic ; Mechanics ; Physics, Applied |
WOS记录号 | WOS:001208837700002 |
出版者 | IOS Press BV |
EI入藏号 | 20241715975720 |
EI主题词 | Image segmentation |
EI分类号 | 951 Materials Science |
原始文献类型 | Journal article (JA) |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/370097 |
专题 | 信息科学与技术学院 信息科学与技术学院_PI研究组_叶朝锋组 信息科学与技术学院_硕士生 |
通讯作者 | Long, Cai; Ye, Chaofeng |
作者单位 | 1.School of Information Science and Technology, ShanghaiTech University, Shanghai, China 2.Yangjiang Nuclear Power Co. Ltd., Guangdong, China |
第一作者单位 | 信息科学与技术学院 |
通讯作者单位 | 信息科学与技术学院 |
第一作者的第一单位 | 信息科学与技术学院 |
推荐引用方式 GB/T 7714 | Long, Cai,Wang, Yuanyuan,Dong, Haoran,et al. High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection[J]. INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS,2024,74(4):299-306. |
APA | Long, Cai,Wang, Yuanyuan,Dong, Haoran,Tao, Yu,&Ye, Chaofeng.(2024).High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection.INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS,74(4),299-306. |
MLA | Long, Cai,et al."High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection".INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS 74.4(2024):299-306. |
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